TY - GEN
T1 - Use of neuro-fuzzy system to time domain electrode circuits fault diagnosis
AU - Grzechca, Damian
AU - Rutkowski, Jerzy
PY - 2005
Y1 - 2005
N2 - This paper presents a new concept to analog fault diagnosis. Problem of distinguishing between healthy or faulty analog circuit has always been very complicated. The most common approach based on pattern recognition, especially on mean square error measure, can not distinguish all faulty circuits from the healthy one. Normally, the dictionary has to include thousands of patterns and even then, the level of fault detection is not satisfactory. A neural network classifier has been proposed to solve the problem. Its generalization ability allows to reduce the dictionary size significantly. This paper shows how to create a neural dictionary for fault location. Moreover, at the first stage of classification, the fuzzy logic is utilized to transform a measurement vector into a zero - one range. The information from the Circuit Under Test (CUT) has to be as high as it is possible but at the same time the stimuli has to be as simple as possible. The most common AC and DC tests don't give the best solution. Therefore, the time domain testing with pulse stimuli has been utilized. his paper presents a new concept to analog fault diagnosis.
AB - This paper presents a new concept to analog fault diagnosis. Problem of distinguishing between healthy or faulty analog circuit has always been very complicated. The most common approach based on pattern recognition, especially on mean square error measure, can not distinguish all faulty circuits from the healthy one. Normally, the dictionary has to include thousands of patterns and even then, the level of fault detection is not satisfactory. A neural network classifier has been proposed to solve the problem. Its generalization ability allows to reduce the dictionary size significantly. This paper shows how to create a neural dictionary for fault location. Moreover, at the first stage of classification, the fuzzy logic is utilized to transform a measurement vector into a zero - one range. The information from the Circuit Under Test (CUT) has to be as high as it is possible but at the same time the stimuli has to be as simple as possible. The most common AC and DC tests don't give the best solution. Therefore, the time domain testing with pulse stimuli has been utilized. his paper presents a new concept to analog fault diagnosis.
UR - https://www.scopus.com/pages/publications/33947662423
M3 - Conference contribution
AN - SCOPUS:33947662423
SN - 1424400201
SN - 9781424400201
T3 - 2005 ICSC Congress on Computational Intelligence Methods and Applications
BT - 2005 ICSC Congress on Computational Intelligence Methods and Applications
T2 - 2005 ICSC Congress on Computational Intelligence Methods and Applications
Y2 - 15 December 2005 through 17 December 2005
ER -