TY - GEN
T1 - Use of neural network and fuzzy logic to time domain analog tasting
AU - Grzechca, D.
AU - Rutkowski, J.
N1 - Publisher Copyright:
© 2002 Nanyang Technological University.
PY - 2002
Y1 - 2002
N2 - This paper deals with fault diagnosis by means of dictionary technique. Problem of distinguishing between healthy or faulty analog circuit has always been very complicated. The most common approach based on pattern recognition, especially on mean square error measure, cannot distinguish all faulty circuits from the healthy one. Normally, the dictionary has to include thousands of patterns and even then, die level of fault detection is not satisfactory. A neural network classifier has been proposed to solve the problem. Its generalization ability allows to reduce the dictionary size significantly. This paper shows how to create a neural dictionary for fault location. Moreover, at the first stage of classification, the fuzzy logic is utilized to transform a measurement vector into a zero-one range. The information from the Circuit Under Test (CUT) has to be as high as it is possible but at the same time the stimuli has to be as simple as possible. The most common AC and DC tests don't give the best solution. Therefore, the time domain testing with pulse stimuli has been utilized.
AB - This paper deals with fault diagnosis by means of dictionary technique. Problem of distinguishing between healthy or faulty analog circuit has always been very complicated. The most common approach based on pattern recognition, especially on mean square error measure, cannot distinguish all faulty circuits from the healthy one. Normally, the dictionary has to include thousands of patterns and even then, die level of fault detection is not satisfactory. A neural network classifier has been proposed to solve the problem. Its generalization ability allows to reduce the dictionary size significantly. This paper shows how to create a neural dictionary for fault location. Moreover, at the first stage of classification, the fuzzy logic is utilized to transform a measurement vector into a zero-one range. The information from the Circuit Under Test (CUT) has to be as high as it is possible but at the same time the stimuli has to be as simple as possible. The most common AC and DC tests don't give the best solution. Therefore, the time domain testing with pulse stimuli has been utilized.
UR - https://www.scopus.com/pages/publications/84868339587
U2 - 10.1109/ICONIP.2002.1201966
DO - 10.1109/ICONIP.2002.1201966
M3 - Conference contribution
AN - SCOPUS:84868339587
T3 - ICONIP 2002 - Proceedings of the 9th International Conference on Neural Information Processing: Computational Intelligence for the E-Age
SP - 2601
EP - 2604
BT - ICONIP 2002 - Proceedings of the 9th International Conference on Neural Information Processing
A2 - Yao, Xin
A2 - Fukushima, Kunihiko
A2 - Lee, Soo-Young
A2 - Wang, Lipo
A2 - Rajapakse, Jagath C.
PB - Institute of Electrical and Electronics Engineers Inc.
T2 - 9th International Conference on Neural Information Processing, ICONIP 2002
Y2 - 18 November 2002 through 22 November 2002
ER -