@inproceedings{36020b00eb3e4e3ca2cb487b43717b82,
title = "The method of determining the characteristic features of graphene oxides by atomic force microscopy",
abstract = "In this paper, we present the results of the measurements obtained using atomic force microscopy (AFM). The subject of research were the reduced graphene oxides which were obtained by oxidation (in first step) of the graphites and thermally reduction (in the second step). The three types of graphites (flake, scale and synthetic) and three different method of oxidation were used in the measurements. The special attention was paid to the height and horizontal sizes of the obtained material. The results was analysed and relevant conclusions were drawn from them.",
keywords = "Atomic Force Microscopy, Reduced graphene oxide, graphite, method of oxidation",
author = "S. Drewniak and R. Muzyka",
note = "Publisher Copyright: {\textcopyright} 2018 SPIE.; 13th Conference on Integrated Optics: Sensors, Sensing Structures, and Methods, IOS 2018 ; Conference date: 26-02-2018 Through 02-03-2018",
year = "2018",
doi = "10.1117/12.2503825",
language = "English",
isbn = "9781510622722",
series = "Proceedings of SPIE - The International Society for Optical Engineering",
publisher = "SPIE",
editor = "Przemyslaw Struk and Tadeusz Pustelny and Przemyslaw Struk",
booktitle = "13th Conference on Integrated Optics",
address = "United States",
}