Spectrogoniometric determination of refractive indices of GaSe

Mirosława Kepińska; Marian Nowak; Piotr Duka; Beata Kauch

doi:10.1016/j.tsf.2009.01.069

Spectrogoniometric determination of refractive indices of GaSe

Mirosława Kepińska
, Marian Nowak
, Piotr Duka
, Beata Kauch

Zakład Fizyki Ciała Stałego (RIF/RIF1)

Warsaw University of Life Sciences

Wyniki badań: Wkład do czasopisma › Artykuł › recenzja

12 Cytowania z bazy Scopus

Abstrakt

A simple interference spectroscopy technique of determining real parts of refractive indices in thin isotropic or anisotropic films is presented. This method is based on the evaluation of the orders of extrema in interference spectra of optical transmittance and/or reflectance measured for various angles of light incidence. It also makes possible to determine thickness of the investigated sample. This method of investigations was used to determine the parameters of gallium selenide (GaSe). The determined spectral characteristics of ordinary and extraordinary refractive indices of GaSe are compared with the data presented in literature by other authors.

Język oryginału	angielski
Strony (od–do)	3792-3796
Liczba stron	5
Czasopismo	Thin Solid Films
Tom	517
Numer wydania	13
Identyfikatory DOI	https://doi.org/10.1016/j.tsf.2009.01.069
Status publikacji	Opublikowano - 1 maj 2009

Obszary tematyczne ASJC Scopus

Materiały elektroniczne, optyczne i magnetyczne
Powierzchnie i interfejsy
Powierzchnie, powłoki i filmy
Metale i stopy
Chemia materiałowa

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10.1016/j.tsf.2009.01.069

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abstract = "A simple interference spectroscopy technique of determining real parts of refractive indices in thin isotropic or anisotropic films is presented. This method is based on the evaluation of the orders of extrema in interference spectra of optical transmittance and/or reflectance measured for various angles of light incidence. It also makes possible to determine thickness of the investigated sample. This method of investigations was used to determine the parameters of gallium selenide (GaSe). The determined spectral characteristics of ordinary and extraordinary refractive indices of GaSe are compared with the data presented in literature by other authors.",

keywords = "Anisotropic materials, Gallium selenide, Refractive index, Spectrogoniometry, Thin films",

author = "Miros{\l}awa Kepi{\'n}ska and Marian Nowak and Piotr Duka and Beata Kauch",

year = "2009",

month = may,

day = "1",

doi = "10.1016/j.tsf.2009.01.069",

language = "English",

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journal = "Thin Solid Films",

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TY - JOUR

T1 - Spectrogoniometric determination of refractive indices of GaSe

AU - Kepińska, Mirosława

AU - Nowak, Marian

AU - Duka, Piotr

AU - Kauch, Beata

PY - 2009/5/1

Y1 - 2009/5/1

N2 - A simple interference spectroscopy technique of determining real parts of refractive indices in thin isotropic or anisotropic films is presented. This method is based on the evaluation of the orders of extrema in interference spectra of optical transmittance and/or reflectance measured for various angles of light incidence. It also makes possible to determine thickness of the investigated sample. This method of investigations was used to determine the parameters of gallium selenide (GaSe). The determined spectral characteristics of ordinary and extraordinary refractive indices of GaSe are compared with the data presented in literature by other authors.

AB - A simple interference spectroscopy technique of determining real parts of refractive indices in thin isotropic or anisotropic films is presented. This method is based on the evaluation of the orders of extrema in interference spectra of optical transmittance and/or reflectance measured for various angles of light incidence. It also makes possible to determine thickness of the investigated sample. This method of investigations was used to determine the parameters of gallium selenide (GaSe). The determined spectral characteristics of ordinary and extraordinary refractive indices of GaSe are compared with the data presented in literature by other authors.

KW - Anisotropic materials

KW - Gallium selenide

KW - Refractive index

KW - Spectrogoniometry

KW - Thin films

UR - https://www.scopus.com/pages/publications/64349112976

U2 - 10.1016/j.tsf.2009.01.069

DO - 10.1016/j.tsf.2009.01.069

M3 - Article

AN - SCOPUS:64349112976

SN - 0040-6090

VL - 517

SP - 3792

EP - 3796

JO - Thin Solid Films

JF - Thin Solid Films

IS - 13

ER -

Spectrogoniometric determination of refractive indices of GaSe

Abstrakt

Obszary tematyczne ASJC Scopus

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