TY - GEN
T1 - Specialised excitation and wavelet feature extraction in fault diagnosis of analog electronic circuits
AU - Chruszczyk,
AU - Rutkowski, J.
PY - 2008
Y1 - 2008
N2 - This article presents design of specialised aperiodic excitation. Purpose is improvement of fault diagnosis of analog electronic circuits. The goal is enhancement of catastrophic (hard) faults location. Further improvement is achieved after utilising additional feature extraction by means of wavelet transform. Obtained results are compared to fault diagnosis without feature extraction and diagnosis with the simplest aperiodic excitation: step function.
AB - This article presents design of specialised aperiodic excitation. Purpose is improvement of fault diagnosis of analog electronic circuits. The goal is enhancement of catastrophic (hard) faults location. Further improvement is achieved after utilising additional feature extraction by means of wavelet transform. Obtained results are compared to fault diagnosis without feature extraction and diagnosis with the simplest aperiodic excitation: step function.
UR - https://www.scopus.com/pages/publications/57849128131
U2 - 10.1109/ICECS.2008.4674836
DO - 10.1109/ICECS.2008.4674836
M3 - Conference contribution
AN - SCOPUS:57849128131
SN - 9781424421824
T3 - Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008
SP - 242
EP - 246
BT - Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008
T2 - 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008
Y2 - 31 August 2008 through 3 September 2008
ER -