Abstrakt
Electronic properties of the space charge layer of the clean and oxygen exposed SnO2(110) surface have been analysed on the basis of the previously published results concerning the changes of the Fermi level position depending on the annealing temperature and oxygen exposure. Using the model of the differently ionised oxygen vacancies the correlations between recently reported values of the absolute band bending and electrical conductance were observed what was connected with the changes of the effective density of the filled electronic states localised in the band gap below the Fermi level EF and in the upper part of the valence band.
| Język oryginału | angielski |
|---|---|
| Strony (od–do) | 202-204 |
| Liczba stron | 3 |
| Czasopismo | Electron Technology (Warsaw) |
| Tom | 30 |
| Numer wydania | 2 |
| Status publikacji | Opublikowano - 1997 |
| Wydarzenie | Proceedings of the 1996 4th Seminar on Surface and Thin Film Structures - Kazimierz Dolny, Pol Czas trwania: 18 wrz 1996 → 21 wrz 1996 |
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