TY - GEN
T1 - Overview of metrics applicable in embedded systems functional testing
AU - Kimla, Rafal
N1 - Publisher Copyright:
© 2022 Author(s).
PY - 2022/11/23
Y1 - 2022/11/23
N2 - The black-box approach to embedded systems testing, also known as functional testing, requires a special set of metrics to be gathered in order to evaluate its outcome. This article presents the overview of the most common metrics that can assist in measuring the effectiveness of testing and that can be used to compare the different test methodologies or strategies.
AB - The black-box approach to embedded systems testing, also known as functional testing, requires a special set of metrics to be gathered in order to evaluate its outcome. This article presents the overview of the most common metrics that can assist in measuring the effectiveness of testing and that can be used to compare the different test methodologies or strategies.
UR - https://www.scopus.com/pages/publications/85143149643
U2 - 10.1063/5.0119761
DO - 10.1063/5.0119761
M3 - Conference contribution
AN - SCOPUS:85143149643
T3 - AIP Conference Proceedings
BT - International Conference of Computational Methods in Sciences and Engineering, ICCMSE 2021
A2 - Simos, Theodore
A2 - Simos, Theodore
A2 - Simos, Theodore
A2 - Tsitouras, Charalambos
A2 - Kalogiratou, Zacharoula
A2 - Monovasilis, Theodore
PB - American Institute of Physics Inc.
T2 - International Conference of Computational Methods in Sciences and Engineering 2021, ICCMSE 2021
Y2 - 4 September 2021 through 7 September 2021
ER -