Optical identification of crystal defects in CCD matrix

Adam Popowicz

Optical identification of crystal defects in CCD matrix

Przetłumaczony tytuł wkładu: Identyfikacja defektów struktury krystalicznej matryce CCD

Adam Popowicz

Katedra Elektroniki, Elektrotechniki i Mikroelektroniki (RAU/RAU11)

Wyniki badań: Wkład do czasopisma › Artykuł › recenzja

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Abstrakt

An original idea of semiconductor defects identification in CCD matrix was presented in the article. The procedure is simple and easy to execute because of no need for special and expensive equipment. The method classifies defects into two groups: the point defects and the spatial defects (dislocations). During the experiments it was proven that the type of defect affects the behavior of the dark current generation during the light gathering.

Przetłumaczony tytuł wkładu	Identyfikacja defektów struktury krystalicznej matryce CCD
Język oryginału	angielski
Strony (od–do)	79-82
Liczba stron	4
Czasopismo	Przeglad Elektrotechniczny
Tom	89
Numer wydania	3 A
Status publikacji	Opublikowano - 2013

Obszary tematyczne ASJC Scopus

Inżynieria elektryczna i elektroniczna

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title = "Optical identification of crystal defects in CCD matrix",

abstract = "An original idea of semiconductor defects identification in CCD matrix was presented in the article. The procedure is simple and easy to execute because of no need for special and expensive equipment. The method classifies defects into two groups: the point defects and the spatial defects (dislocations). During the experiments it was proven that the type of defect affects the behavior of the dark current generation during the light gathering.",

keywords = "CCD matrix, Dark current, Semiconductor defects",

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year = "2013",

language = "English",

volume = "89",

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AU - Popowicz, Adam

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AB - An original idea of semiconductor defects identification in CCD matrix was presented in the article. The procedure is simple and easy to execute because of no need for special and expensive equipment. The method classifies defects into two groups: the point defects and the spatial defects (dislocations). During the experiments it was proven that the type of defect affects the behavior of the dark current generation during the light gathering.

KW - CCD matrix

KW - Dark current

KW - Semiconductor defects

UR - https://www.scopus.com/pages/publications/84874628081

M3 - Article

AN - SCOPUS:84874628081

SN - 0033-2097

VL - 89

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Optical identification of crystal defects in CCD matrix

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Obszary tematyczne ASJC Scopus

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