Measuring system to registration of near field power distribution in modes of planar and strip waveguides

Waldemar T. Wójcik; Aleksander Opilski; Kazimierz Gut; Paweł Karasiński

doi:10.1117/12.409189

Measuring system to registration of near field power distribution in modes of planar and strip waveguides

Waldemar T. Wójcik
, Aleksander Opilski
, Kazimierz Gut
, Paweł Karasiński

Katedra Optoelektroniki (RE/RE4)

TP S.A.
Silesian University of Technology

Wyniki badań: Wkład do czasopisma › Artykuł › recenzja

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Abstrakt

A measuring assembly to examine the distribution of light intensity in near field of planar and strip waveguides was presented. The image of near-field intensity distribution of waveguide modes was showed as well as their interferrential changes caused by the change in optic features of waveguide structure. The presented version of the station was the one to measure the power guided in particular modes with the same polarisation states.

Język oryginału	angielski
Strony (od–do)	192-198
Liczba stron	7
Czasopismo	Proceedings of SPIE - The International Society for Optical Engineering
Tom	4239
Identyfikatory DOI	https://doi.org/10.1117/12.409189
Status publikacji	Opublikowano - 2000

Obszary tematyczne ASJC Scopus

Materiały elektroniczne, optyczne i magnetyczne
Fizyka materii skondensowanej
Zastosowania informatyki
Matematyka stosowana
Inżynieria elektryczna i elektroniczna

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10.1117/12.409189

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abstract = "A measuring assembly to examine the distribution of light intensity in near field of planar and strip waveguides was presented. The image of near-field intensity distribution of waveguide modes was showed as well as their interferrential changes caused by the change in optic features of waveguide structure. The presented version of the station was the one to measure the power guided in particular modes with the same polarisation states.",

keywords = "Difference interferometer, Near-field intensity, Optoelectronical didactics, Planar waveguides",

author = "W{\'o}jcik, \{Waldemar T.\} and Aleksander Opilski and Kazimierz Gut and Pawe{\l} Karasi{\'n}ski",

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journal = "Proceedings of SPIE - The International Society for Optical Engineering",

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TY - JOUR

T1 - Measuring system to registration of near field power distribution in modes of planar and strip waveguides

AU - Wójcik, Waldemar T.

AU - Opilski, Aleksander

AU - Gut, Kazimierz

AU - Karasiński, Paweł

PY - 2000

Y1 - 2000

N2 - A measuring assembly to examine the distribution of light intensity in near field of planar and strip waveguides was presented. The image of near-field intensity distribution of waveguide modes was showed as well as their interferrential changes caused by the change in optic features of waveguide structure. The presented version of the station was the one to measure the power guided in particular modes with the same polarisation states.

AB - A measuring assembly to examine the distribution of light intensity in near field of planar and strip waveguides was presented. The image of near-field intensity distribution of waveguide modes was showed as well as their interferrential changes caused by the change in optic features of waveguide structure. The presented version of the station was the one to measure the power guided in particular modes with the same polarisation states.

KW - Difference interferometer

KW - Near-field intensity

KW - Optoelectronical didactics

KW - Planar waveguides

UR - https://www.scopus.com/pages/publications/0034454560

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DO - 10.1117/12.409189

M3 - Article

AN - SCOPUS:0034454560

SN - 0277-786X

VL - 4239

SP - 192

EP - 198

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

ER -

Measuring system to registration of near field power distribution in modes of planar and strip waveguides

Abstrakt

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