IVD modulus error measurement

Tadeusz Skubis; Artur Skorkowski

IVD modulus error measurement

Tadeusz Skubis
, Artur Skorkowski

Katedra Metrologii, Elektroniki i Automatyki (RE/RE2)

Wyniki badań: Wkład w konferencję › Artykuł › recenzja

2 Cytowania z bazy Scopus

Abstrakt

A calibration method for inductive voltage dividers (IVD) designed for application to AC/DC transfer is described. The measurement method depends on capacitors, charged by the voltage of subsequent IVD sections. The capacitors serve as memory units, remembering section voltages. The circuit is modified and simplified by using different memory element. The memory is realized by RMS/DC converter with DC DVM on the output or by A/D converter and PC card. Essential source of the circuit error remains the same: unstability of the internal load of the circuit, but its minimization seems to be easier. The method presented makes it possible to find the IVD modulus error in the frequency range of up to 1 MHz.

Język oryginału	angielski
Strony	1696-1698
Liczba stron	3
Status publikacji	Opublikowano - 1999
Wydarzenie	Proceedings of the 1999 16th IEEE Instrumentation and Measurement Technology Conference, IMTC/99 - Measurements for the new Millenium - Venice, Italy Czas trwania: 24 cze 1999 → 26 cze 1999

Konferencja

Konferencja	Proceedings of the 1999 16th IEEE Instrumentation and Measurement Technology Conference, IMTC/99 - Measurements for the new Millenium
Miejscowość	Venice, Italy
Okres	24/06/99 → 26/06/99

Obszary tematyczne ASJC Scopus

Inżynieria elektryczna i elektroniczna

Inne pliki i linki

Link do publikacji w Scopus

Cytowanie

@conference{1969f6074d3a4af89cbe7483202a396d,

title = "IVD modulus error measurement",

abstract = "A calibration method for inductive voltage dividers (IVD) designed for application to AC/DC transfer is described. The measurement method depends on capacitors, charged by the voltage of subsequent IVD sections. The capacitors serve as memory units, remembering section voltages. The circuit is modified and simplified by using different memory element. The memory is realized by RMS/DC converter with DC DVM on the output or by A/D converter and PC card. Essential source of the circuit error remains the same: unstability of the internal load of the circuit, but its minimization seems to be easier. The method presented makes it possible to find the IVD modulus error in the frequency range of up to 1 MHz.",

author = "Tadeusz Skubis and Artur Skorkowski",

year = "1999",

language = "English",

pages = "1696--1698",

note = "Proceedings of the 1999 16th IEEE Instrumentation and Measurement Technology Conference, IMTC/99 - Measurements for the new Millenium ; Conference date: 24-06-1999 Through 26-06-1999",

}

TY - CONF

T1 - IVD modulus error measurement

AU - Skubis, Tadeusz

AU - Skorkowski, Artur

PY - 1999

Y1 - 1999

N2 - A calibration method for inductive voltage dividers (IVD) designed for application to AC/DC transfer is described. The measurement method depends on capacitors, charged by the voltage of subsequent IVD sections. The capacitors serve as memory units, remembering section voltages. The circuit is modified and simplified by using different memory element. The memory is realized by RMS/DC converter with DC DVM on the output or by A/D converter and PC card. Essential source of the circuit error remains the same: unstability of the internal load of the circuit, but its minimization seems to be easier. The method presented makes it possible to find the IVD modulus error in the frequency range of up to 1 MHz.

AB - A calibration method for inductive voltage dividers (IVD) designed for application to AC/DC transfer is described. The measurement method depends on capacitors, charged by the voltage of subsequent IVD sections. The capacitors serve as memory units, remembering section voltages. The circuit is modified and simplified by using different memory element. The memory is realized by RMS/DC converter with DC DVM on the output or by A/D converter and PC card. Essential source of the circuit error remains the same: unstability of the internal load of the circuit, but its minimization seems to be easier. The method presented makes it possible to find the IVD modulus error in the frequency range of up to 1 MHz.

UR - https://www.scopus.com/pages/publications/0032686895

M3 - Paper

AN - SCOPUS:0032686895

SP - 1696

EP - 1698

T2 - Proceedings of the 1999 16th IEEE Instrumentation and Measurement Technology Conference, IMTC/99 - Measurements for the new Millenium

Y2 - 24 June 1999 through 26 June 1999

ER -

IVD modulus error measurement

Abstrakt

Konferencja

Obszary tematyczne ASJC Scopus

Inne pliki i linki

Fingerprint

Cytowanie