Influence of probe-sample temperature difference on thermal mapping contrast in scanning thermal microscopy imaging

The purpose of this work is to investigate the influence of a temperature difference through a probe-sample contact on thermal contrast in Scanning Thermal Microscopy imaging. A variety of combinations of temperature differences in the probe-sample system were first analyzed based on an electro-thermal finite element model. The numerical analysis included cooling the sample, as well as heating the sample and the probe. Due to the simplicity in the implementation, experimental verification involved modifying the standard imaging technique by heating the sample. Experiments were carried out in the temperature range between 298 K and 328 K. Contrast in thermal mapping was improved for a low probe current with a heated sample.