Improved digital I/O ports enhance testability of interconnections

Adam Kristof

Improved digital I/O ports enhance testability of interconnections

Adam Kristof

Katedra Automatyki i Robotyki (RAU/RAU3)

Wyniki badań: Wkład do czasopisma › Artykuł z konferencji › recenzja

1 Cytowanie z bazy Scopus

Abstrakt

In this paper improved I/O ports for digital integrated circuits are presented. These new I/O ports have controllable electrical properties and built-in overload detectors. The first feature ensures a desirable interconnection fault model during testing. The built-in overload detectors enable short circuits and overloads to be detected on-line. An example design, cost estimation and experimental results are described.

Język oryginału	angielski
Strony (od–do)	763-772
Liczba stron	10
Czasopismo	IEEE International Test Conference (TC)
Status publikacji	Opublikowano - 2002
Wydarzenie	Proceedings International Test Conference - Baltimore, MD, Stany Zjednoczone Czas trwania: 7 paź 2002 → 10 paź 2002

Obszary tematyczne ASJC Scopus

Inżynieria elektryczna i elektroniczna
Matematyka stosowana

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Cytowanie

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abstract = "In this paper improved I/O ports for digital integrated circuits are presented. These new I/O ports have controllable electrical properties and built-in overload detectors. The first feature ensures a desirable interconnection fault model during testing. The built-in overload detectors enable short circuits and overloads to be detected on-line. An example design, cost estimation and experimental results are described.",

author = "Adam Kristof",

year = "2002",

language = "English",

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journal = "IEEE International Test Conference (TC)",

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AB - In this paper improved I/O ports for digital integrated circuits are presented. These new I/O ports have controllable electrical properties and built-in overload detectors. The first feature ensures a desirable interconnection fault model during testing. The built-in overload detectors enable short circuits and overloads to be detected on-line. An example design, cost estimation and experimental results are described.

UR - https://www.scopus.com/pages/publications/0036446826

M3 - Conference article

AN - SCOPUS:0036446826

SN - 1089-3539

SP - 763

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JO - IEEE International Test Conference (TC)

JF - IEEE International Test Conference (TC)

T2 - Proceedings International Test Conference

Y2 - 7 October 2002 through 10 October 2002

ER -

Improved digital I/O ports enhance testability of interconnections

Abstrakt

Obszary tematyczne ASJC Scopus

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Cytowanie