Global parametric faults identification with the use of differential evolution

P. Jantos; D. Grzechca; J. Rutkowski

doi:10.1109/DDECS.2009.5012133

Global parametric faults identification with the use of differential evolution

P. Jantos
, D. Grzechca
, J. Rutkowski

Katedra Elektroniki, Elektrotechniki i Mikroelektroniki (RAU/RAU11)

Silesian University of Technology

Wyniki badań: Rozdział w książce/raport/materiał konferencyjny › Wkład w konferencję › recenzja

5 Cytowania z bazy Scopus

Abstrakt

This paper presents a novel method to a multiple parametric faults diagnosis (global parametric faults - GPF) in analogue integrated circuits (AIC). The method is based on features of AIC time domain response to voltage step excitation, i.e. AIC response and its first order derivative maxima and minima locations. A circuit states classification is acquired with the use of linear evolutionary classifier which parameters are determined with the use of Differential Evolution. Selected AIC response features distributions are approximated with geometric figures based on polynomial functions. The proposed diagnosis method has been applied for a GPF diagnosis in an exemplary integrated circuit - operational amplifier μA741.

Język oryginału	angielski
Tytuł publikacji goszczącej	Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009
Strony	222-225
Liczba stron	4
Identyfikatory DOI	https://doi.org/10.1109/DDECS.2009.5012133
Status publikacji	Opublikowano - 2009
Wydarzenie	2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009 - Liberec, Republika Czeska Czas trwania: 15 kwi 2009 → 17 kwi 2009

Seria publikacji

Nazwa	Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009

Konferencja

Konferencja	2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009
Kraj/Terytorium	Republika Czeska
Miejscowość	Liberec
Okres	15/04/09 → 17/04/09

Obszary tematyczne ASJC Scopus

Sprzęt i architektura
Inżynieria sterowania i systemów
Inżynieria elektryczna i elektroniczna

Uzyskaj dostęp do dokumentu

10.1109/DDECS.2009.5012133

Inne pliki i linki

Link do publikacji w Scopus

Cytowanie

Jantos, P., Grzechca, D., & Rutkowski, J. (2009). Global parametric faults identification with the use of differential evolution. W Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009 (str. 222-225). Artykułu 5012133 (Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009). https://doi.org/10.1109/DDECS.2009.5012133

Jantos, P. ; Grzechca, D. ; Rutkowski, J. / Global parametric faults identification with the use of differential evolution. Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009. 2009. str. 222-225 (Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009).

@inproceedings{929cb8c64e824175b0f409a04b70c547,

title = "Global parametric faults identification with the use of differential evolution",

abstract = "This paper presents a novel method to a multiple parametric faults diagnosis (global parametric faults - GPF) in analogue integrated circuits (AIC). The method is based on features of AIC time domain response to voltage step excitation, i.e. AIC response and its first order derivative maxima and minima locations. A circuit states classification is acquired with the use of linear evolutionary classifier which parameters are determined with the use of Differential Evolution. Selected AIC response features distributions are approximated with geometric figures based on polynomial functions. The proposed diagnosis method has been applied for a GPF diagnosis in an exemplary integrated circuit - operational amplifier μA741.",

author = "P. Jantos and D. Grzechca and J. Rutkowski",

year = "2009",

doi = "10.1109/DDECS.2009.5012133",

language = "English",

isbn = "9781424433391",

series = "Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009",

pages = "222--225",

booktitle = "Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009",

note = "2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009 ; Conference date: 15-04-2009 Through 17-04-2009",

}

Jantos, P, Grzechca, D & Rutkowski, J 2009, Global parametric faults identification with the use of differential evolution. w Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009., 5012133, Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009, str. 222-225, 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009, Liberec, Republika Czeska, 15/04/09. https://doi.org/10.1109/DDECS.2009.5012133

Global parametric faults identification with the use of differential evolution. / Jantos, P.; Grzechca, D.; Rutkowski, J.
Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009. 2009. str. 222-225 5012133 (Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009).

Wyniki badań: Rozdział w książce/raport/materiał konferencyjny › Wkład w konferencję › recenzja

TY - GEN

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AU - Grzechca, D.

AU - Rutkowski, J.

PY - 2009

Y1 - 2009

N2 - This paper presents a novel method to a multiple parametric faults diagnosis (global parametric faults - GPF) in analogue integrated circuits (AIC). The method is based on features of AIC time domain response to voltage step excitation, i.e. AIC response and its first order derivative maxima and minima locations. A circuit states classification is acquired with the use of linear evolutionary classifier which parameters are determined with the use of Differential Evolution. Selected AIC response features distributions are approximated with geometric figures based on polynomial functions. The proposed diagnosis method has been applied for a GPF diagnosis in an exemplary integrated circuit - operational amplifier μA741.

AB - This paper presents a novel method to a multiple parametric faults diagnosis (global parametric faults - GPF) in analogue integrated circuits (AIC). The method is based on features of AIC time domain response to voltage step excitation, i.e. AIC response and its first order derivative maxima and minima locations. A circuit states classification is acquired with the use of linear evolutionary classifier which parameters are determined with the use of Differential Evolution. Selected AIC response features distributions are approximated with geometric figures based on polynomial functions. The proposed diagnosis method has been applied for a GPF diagnosis in an exemplary integrated circuit - operational amplifier μA741.

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U2 - 10.1109/DDECS.2009.5012133

DO - 10.1109/DDECS.2009.5012133

M3 - Conference contribution

AN - SCOPUS:70349316611

SN - 9781424433391

T3 - Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009

SP - 222

EP - 225

BT - Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009

T2 - 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009

Y2 - 15 April 2009 through 17 April 2009

ER -

Jantos P, Grzechca D, Rutkowski J. Global parametric faults identification with the use of differential evolution. W Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009. 2009. str. 222-225. 5012133. (Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009). doi: 10.1109/DDECS.2009.5012133

Global parametric faults identification with the use of differential evolution

Abstrakt

Seria publikacji

Konferencja

Obszary tematyczne ASJC Scopus

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Inne pliki i linki

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Cytowanie