Fringe pattern field analysis in planar waveguides investigation

R. Rogoziński; A. Opilski

doi:10.1117/12.301331

Fringe pattern field analysis in planar waveguides investigation

R. Rogoziński
, A. Opilski

Katedra Optoelektroniki (RE/RE4)

Silesian University of Technology

Wyniki badań: Wkład do czasopisma › Artykuł z konferencji › recenzja

Abstrakt

A fringe pattern field was analyzed to determine the profile of refractive index of planar waveguides. The refractive profiles of planar waveguides produced in the soda-lime glass by using an ion exchange Ag⁺↔Na⁺ were also examined. It was shown that the mode spectra during synchronous angle measurements were very dense.

Język oryginału	angielski
Strony (od–do)	165-170
Liczba stron	6
Czasopismo	Proceedings of SPIE - The International Society for Optical Engineering
Tom	3320
Identyfikatory DOI	https://doi.org/10.1117/12.301331
Status publikacji	Opublikowano - 1996
Wydarzenie	Proceedings of the 1997 10th Slovak-Czsch-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics - Karpacz, Polska Czas trwania: 16 wrz 1996 → 20 wrz 1996

Obszary tematyczne ASJC Scopus

Materiały elektroniczne, optyczne i magnetyczne
Fizyka materii skondensowanej
Zastosowania informatyki
Matematyka stosowana
Inżynieria elektryczna i elektroniczna

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10.1117/12.301331

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Cytowanie

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title = "Fringe pattern field analysis in planar waveguides investigation",

abstract = "A fringe pattern field was analyzed to determine the profile of refractive index of planar waveguides. The refractive profiles of planar waveguides produced in the soda-lime glass by using an ion exchange Ag+↔Na+ were also examined. It was shown that the mode spectra during synchronous angle measurements were very dense.",

keywords = "Gradient planar waveguides, Ion exchange in glasses, Refractive index measurements",

author = "R. Rogozi{\'n}ski and A. Opilski",

year = "1996",

doi = "10.1117/12.301331",

language = "English",

volume = "3320",

pages = "165--170",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Proceedings of the 1997 10th Slovak-Czsch-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics ; Conference date: 16-09-1996 Through 20-09-1996",

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TY - JOUR

T1 - Fringe pattern field analysis in planar waveguides investigation

AU - Rogoziński, R.

AU - Opilski, A.

PY - 1996

Y1 - 1996

N2 - A fringe pattern field was analyzed to determine the profile of refractive index of planar waveguides. The refractive profiles of planar waveguides produced in the soda-lime glass by using an ion exchange Ag+↔Na+ were also examined. It was shown that the mode spectra during synchronous angle measurements were very dense.

AB - A fringe pattern field was analyzed to determine the profile of refractive index of planar waveguides. The refractive profiles of planar waveguides produced in the soda-lime glass by using an ion exchange Ag+↔Na+ were also examined. It was shown that the mode spectra during synchronous angle measurements were very dense.

KW - Gradient planar waveguides

KW - Ion exchange in glasses

KW - Refractive index measurements

UR - https://www.scopus.com/pages/publications/0030316388

U2 - 10.1117/12.301331

DO - 10.1117/12.301331

M3 - Conference article

AN - SCOPUS:0030316388

SN - 0277-786X

VL - 3320

SP - 165

EP - 170

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Proceedings of the 1997 10th Slovak-Czsch-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics

Y2 - 16 September 1996 through 20 September 1996

ER -

Fringe pattern field analysis in planar waveguides investigation

Abstrakt

Obszary tematyczne ASJC Scopus

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