Extension of the boundary-scan architecture and new idea of bist for more effective testing and self-testing of interconnections

Adam Kristof

doi:10.1109/edtc.1997.582443

Extension of the boundary-scan architecture and new idea of bist for more effective testing and self-testing of interconnections

Adam Kristof

Katedra Automatyki i Robotyki (RAU/RAU3)

Wyniki badań: Rozdział w książce/raport/materiał konferencyjny › Wkład w konferencję › recenzja

Abstrakt

The approach presented in this paper enables more effective testing of on-board and board-to-board interconnections and significantly simplifies the interconnection self-testing. Some extensions must be added to the Boundary Scan Architecture which however do not violate the JTAG/IEEE 1149.1 standard requirements. Benefits are the reduced complexity and cost of an on-board testing unit as well as better test performance.

Język oryginału	angielski
Tytuł publikacji goszczącej	Proceedings - European Conference on Design and Test, ED and TC 1997
Wydawca	Association for Computing Machinery
Strony	630
Liczba stron	1
ISBN (elektroniczny)	0818677864, 9780818677861
Identyfikatory DOI	https://doi.org/10.1109/edtc.1997.582443
Status publikacji	Opublikowano - 17 mar 1997
Wydarzenie	1997 European Conference on Design and Test, ED and TC 1997 - Paris, Francja Czas trwania: 17 mar 1997 → 20 mar 1997

Seria publikacji

Nazwa	Proceedings of the 1997 European Conference on Design and Test, EDTC 1997

Konferencja

Konferencja	1997 European Conference on Design and Test, ED and TC 1997
Kraj/Terytorium	Francja
Miejscowość	Paris
Okres	17/03/97 → 20/03/97

Obszary tematyczne ASJC Scopus

Inżynieria sterowania i systemów
Informatyka ogólna

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10.1109/edtc.1997.582443

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Cytowanie

Kristof, A. (1997). Extension of the boundary-scan architecture and new idea of bist for more effective testing and self-testing of interconnections. W Proceedings - European Conference on Design and Test, ED and TC 1997 (str. 630). (Proceedings of the 1997 European Conference on Design and Test, EDTC 1997). Association for Computing Machinery. https://doi.org/10.1109/edtc.1997.582443

@inproceedings{b0a4d51f57504f41a1836b2cfb1be780,

title = "Extension of the boundary-scan architecture and new idea of bist for more effective testing and self-testing of interconnections",

abstract = "The approach presented in this paper enables more effective testing of on-board and board-to-board interconnections and significantly simplifies the interconnection self-testing. Some extensions must be added to the Boundary Scan Architecture which however do not violate the JTAG/IEEE 1149.1 standard requirements. Benefits are the reduced complexity and cost of an on-board testing unit as well as better test performance.",

author = "Adam Kristof",

note = "Publisher Copyright: {\textcopyright} 1997 IEEE.; 1997 European Conference on Design and Test, ED and TC 1997 ; Conference date: 17-03-1997 Through 20-03-1997",

year = "1997",

month = mar,

day = "17",

doi = "10.1109/edtc.1997.582443",

language = "English",

series = "Proceedings of the 1997 European Conference on Design and Test, EDTC 1997",

publisher = "Association for Computing Machinery",

pages = "630",

booktitle = "Proceedings - European Conference on Design and Test, ED and TC 1997",

address = "United States",

}

Kristof, A 1997, Extension of the boundary-scan architecture and new idea of bist for more effective testing and self-testing of interconnections. w Proceedings - European Conference on Design and Test, ED and TC 1997. Proceedings of the 1997 European Conference on Design and Test, EDTC 1997, Association for Computing Machinery, str. 630, 1997 European Conference on Design and Test, ED and TC 1997, Paris, Francja, 17/03/97. https://doi.org/10.1109/edtc.1997.582443

Extension of the boundary-scan architecture and new idea of bist for more effective testing and self-testing of interconnections. / Kristof, Adam.
Proceedings - European Conference on Design and Test, ED and TC 1997. Association for Computing Machinery, 1997. str. 630 (Proceedings of the 1997 European Conference on Design and Test, EDTC 1997).

Wyniki badań: Rozdział w książce/raport/materiał konferencyjny › Wkład w konferencję › recenzja

TY - GEN

T1 - Extension of the boundary-scan architecture and new idea of bist for more effective testing and self-testing of interconnections

AU - Kristof, Adam

PY - 1997/3/17

Y1 - 1997/3/17

N2 - The approach presented in this paper enables more effective testing of on-board and board-to-board interconnections and significantly simplifies the interconnection self-testing. Some extensions must be added to the Boundary Scan Architecture which however do not violate the JTAG/IEEE 1149.1 standard requirements. Benefits are the reduced complexity and cost of an on-board testing unit as well as better test performance.

AB - The approach presented in this paper enables more effective testing of on-board and board-to-board interconnections and significantly simplifies the interconnection self-testing. Some extensions must be added to the Boundary Scan Architecture which however do not violate the JTAG/IEEE 1149.1 standard requirements. Benefits are the reduced complexity and cost of an on-board testing unit as well as better test performance.

UR - https://www.scopus.com/pages/publications/85029617221

U2 - 10.1109/edtc.1997.582443

DO - 10.1109/edtc.1997.582443

M3 - Conference contribution

AN - SCOPUS:85029617221

T3 - Proceedings of the 1997 European Conference on Design and Test, EDTC 1997

SP - 630

BT - Proceedings - European Conference on Design and Test, ED and TC 1997

PB - Association for Computing Machinery

T2 - 1997 European Conference on Design and Test, ED and TC 1997

Y2 - 17 March 1997 through 20 March 1997

ER -

Kristof A. Extension of the boundary-scan architecture and new idea of bist for more effective testing and self-testing of interconnections. W Proceedings - European Conference on Design and Test, ED and TC 1997. Association for Computing Machinery. 1997. str. 630. (Proceedings of the 1997 European Conference on Design and Test, EDTC 1997). doi: 10.1109/edtc.1997.582443

Extension of the boundary-scan architecture and new idea of bist for more effective testing and self-testing of interconnections

Abstrakt

Seria publikacji

Konferencja

Obszary tematyczne ASJC Scopus

Uzyskaj dostęp do dokumentu

Inne pliki i linki

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Cytowanie