Excitation optimization in fault diagnosis of analog electronic circuits

J. Rutkowski

doi:10.1109/DDECS.2008.4538802

Excitation optimization in fault diagnosis of analog electronic circuits

Chruszczyk
, J. Rutkowski

Katedra Elektroniki, Elektrotechniki i Mikroelektroniki (RAU/RAU11)

Silesian University of Technology

Wyniki badań: Wkład w konferencję › Artykuł › recenzja

6 Cytowania z bazy Scopus

Abstrakt

This article describes optimization of excitation signal for purpose of fault diagnosis. The goal is to enhance efficiency of faults detection in analog electronic circuits. The method has been verified on cases with single hard (catastrophic) and soft (parametric) faults. Further enhancement of fault detection efficiency has been achieved with additional feature extraction by means of wavelet transform. Obtained results have been compared with diagnosis using step function excitation and diagnosis without feature extraction.

Język oryginału	angielski
Strony	279-282
Liczba stron	4
Identyfikatory DOI	https://doi.org/10.1109/DDECS.2008.4538802
Status publikacji	Opublikowano - 2008
Wydarzenie	2008 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS - Bratislava, Słowacja Czas trwania: 16 kwi 2008 → 18 kwi 2008

Konferencja

Konferencja	2008 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS
Kraj/Terytorium	Słowacja
Miejscowość	Bratislava
Okres	16/04/08 → 18/04/08

Obszary tematyczne ASJC Scopus

Inżynieria elektryczna i elektroniczna
Inżynieria sterowania i systemów

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10.1109/DDECS.2008.4538802

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Cytowanie

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title = "Excitation optimization in fault diagnosis of analog electronic circuits",

abstract = "This article describes optimization of excitation signal for purpose of fault diagnosis. The goal is to enhance efficiency of faults detection in analog electronic circuits. The method has been verified on cases with single hard (catastrophic) and soft (parametric) faults. Further enhancement of fault detection efficiency has been achieved with additional feature extraction by means of wavelet transform. Obtained results have been compared with diagnosis using step function excitation and diagnosis without feature extraction.",

author = "Chruszczyk and J. Rutkowski",

year = "2008",

doi = "10.1109/DDECS.2008.4538802",

language = "English",

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AU - Chruszczyk,

AU - Rutkowski, J.

PY - 2008

Y1 - 2008

N2 - This article describes optimization of excitation signal for purpose of fault diagnosis. The goal is to enhance efficiency of faults detection in analog electronic circuits. The method has been verified on cases with single hard (catastrophic) and soft (parametric) faults. Further enhancement of fault detection efficiency has been achieved with additional feature extraction by means of wavelet transform. Obtained results have been compared with diagnosis using step function excitation and diagnosis without feature extraction.

AB - This article describes optimization of excitation signal for purpose of fault diagnosis. The goal is to enhance efficiency of faults detection in analog electronic circuits. The method has been verified on cases with single hard (catastrophic) and soft (parametric) faults. Further enhancement of fault detection efficiency has been achieved with additional feature extraction by means of wavelet transform. Obtained results have been compared with diagnosis using step function excitation and diagnosis without feature extraction.

UR - https://www.scopus.com/pages/publications/50649099268

U2 - 10.1109/DDECS.2008.4538802

DO - 10.1109/DDECS.2008.4538802

M3 - Paper

AN - SCOPUS:50649099268

SP - 279

EP - 282

T2 - 2008 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS

Y2 - 16 April 2008 through 18 April 2008

ER -

Excitation optimization in fault diagnosis of analog electronic circuits

Abstrakt

Konferencja

Obszary tematyczne ASJC Scopus

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