Determination of dispersed phase area fraction with joined method employing light, scanning and transmission electron microscopy

Janusz Richter; Jan Cwajna

doi:10.1515/pm-1997-340103

Determination of dispersed phase area fraction with joined method employing light, scanning and transmission electron microscopy

Janusz Richter
, Jan Cwajna

Katedra Technologii Materiałowych (RM/RM3)

Silesian University of Technology

Wyniki badań: Wkład do czasopisma › Artykuł › recenzja

4 Cytowania z bazy Scopus

Abstrakt

The aim of the study was to evaluate thoroughly (within the whole size range) and objectively (with no erroneous influence of large particle distances and arrangement) the area fraction (A_A) of the carbide phase in a new grade of high speed steel (HSS) containing Ti and Nb. To meet these goals, the so called joined method of quantitative metallography (QM), employing light (LM), scanning (SEM) and transmission electron microscopy (TEM), was suggested. Area fractions obtained this way - (A_A)_LM, (A_A)_SEM, (A_A)_TEM are not additive and total A_A is given by: A_A = (A_A)_LM + (A_A)_SEM + (A_A)_TEM - (A_A)_LM·(A_A)_SEM-(A _A)_LM·(A_A)_TEM-(A _A)_SEM·(A_A)_TEM + (A_A)_LM·(A_A)_SEM·(A _A)_TEM ≤ 1.

Język oryginału	angielski
Strony (od–do)	23-31
Liczba stron	9
Czasopismo	Practical Metallography
Tom	34
Numer wydania	1
Identyfikatory DOI	https://doi.org/10.1515/pm-1997-340103
Status publikacji	Opublikowano - 1997

Obszary tematyczne ASJC Scopus

Materiały elektroniczne, optyczne i magnetyczne
Fizyka materii skondensowanej
Mechanika materiałowa
Metale i stopy

Uzyskaj dostęp do dokumentu

10.1515/pm-1997-340103

Inne pliki i linki

Link do publikacji w Scopus

Cytowanie

@article{ac5eb7cb15ae4f65ad9d2cee9f799287,

title = "Determination of dispersed phase area fraction with joined method employing light, scanning and transmission electron microscopy",

abstract = "The aim of the study was to evaluate thoroughly (within the whole size range) and objectively (with no erroneous influence of large particle distances and arrangement) the area fraction (AA) of the carbide phase in a new grade of high speed steel (HSS) containing Ti and Nb. To meet these goals, the so called joined method of quantitative metallography (QM), employing light (LM), scanning (SEM) and transmission electron microscopy (TEM), was suggested. Area fractions obtained this way - (AA)LM, (AA)SEM, (AA)TEM are not additive and total AA is given by: AA = (AA)LM + (AA)SEM + (AA)TEM - (AA)LM·(AA)SEM-(A A)LM·(AA)TEM-(A A)SEM·(AA)TEM + (AA)LM·(AA)SEM·(A A)TEM ≤ 1.",

author = "Janusz Richter and Jan Cwajna",

year = "1997",

doi = "10.1515/pm-1997-340103",

language = "English",

volume = "34",

pages = "23--31",

journal = "Practical Metallography",

issn = "0032-678X",

publisher = "Walter de Gruyter GmbH",

number = "1",

}

TY - JOUR

T1 - Determination of dispersed phase area fraction with joined method employing light, scanning and transmission electron microscopy

AU - Richter, Janusz

AU - Cwajna, Jan

PY - 1997

Y1 - 1997

N2 - The aim of the study was to evaluate thoroughly (within the whole size range) and objectively (with no erroneous influence of large particle distances and arrangement) the area fraction (AA) of the carbide phase in a new grade of high speed steel (HSS) containing Ti and Nb. To meet these goals, the so called joined method of quantitative metallography (QM), employing light (LM), scanning (SEM) and transmission electron microscopy (TEM), was suggested. Area fractions obtained this way - (AA)LM, (AA)SEM, (AA)TEM are not additive and total AA is given by: AA = (AA)LM + (AA)SEM + (AA)TEM - (AA)LM·(AA)SEM-(A A)LM·(AA)TEM-(A A)SEM·(AA)TEM + (AA)LM·(AA)SEM·(A A)TEM ≤ 1.

AB - The aim of the study was to evaluate thoroughly (within the whole size range) and objectively (with no erroneous influence of large particle distances and arrangement) the area fraction (AA) of the carbide phase in a new grade of high speed steel (HSS) containing Ti and Nb. To meet these goals, the so called joined method of quantitative metallography (QM), employing light (LM), scanning (SEM) and transmission electron microscopy (TEM), was suggested. Area fractions obtained this way - (AA)LM, (AA)SEM, (AA)TEM are not additive and total AA is given by: AA = (AA)LM + (AA)SEM + (AA)TEM - (AA)LM·(AA)SEM-(A A)LM·(AA)TEM-(A A)SEM·(AA)TEM + (AA)LM·(AA)SEM·(A A)TEM ≤ 1.

UR - https://www.scopus.com/pages/publications/0030865405

U2 - 10.1515/pm-1997-340103

DO - 10.1515/pm-1997-340103

M3 - Article

AN - SCOPUS:0030865405

SN - 0032-678X

VL - 34

SP - 23

EP - 31

JO - Practical Metallography

JF - Practical Metallography

IS - 1

ER -

Determination of dispersed phase area fraction with joined method employing light, scanning and transmission electron microscopy

Abstrakt

Obszary tematyczne ASJC Scopus

Uzyskaj dostęp do dokumentu

Inne pliki i linki

Fingerprint

Cytowanie