Application of dielectric layers made in sol-gel technique in the technology of planar waveguide sensors

P. Karasiński

doi:10.1117/12.435923

Application of dielectric layers made in sol-gel technique in the technology of planar waveguide sensors

P. Karasiński

Katedra Optoelektroniki (RE/RE4)

Wyniki badań: Wkład do czasopisma › Artykuł z konferencji › recenzja

3 Cytowania z bazy Scopus

Abstrakt

The work discusses the application potentials of sol-gel technique in the technology of planar waveguide sensors. The capability to form refractive profiles with the use of various techniques applied in planar optics have been compared. The authors present the results of investigation studies involving the application of sol-gel technique of the oxide system SiO₂:TiO₂ for the formation of sensor layers, mask layers and waveguide layers. The influence of the thickness of waveguide layer and of its refractive index on the sensitivity of the meter measuring the refractive index changes and working in the difference interferometer system has been investigated.

Język oryginału	angielski
Strony (od–do)	15-20
Liczba stron	6
Czasopismo	Proceedings of SPIE - The International Society for Optical Engineering
Tom	4516
Identyfikatory DOI	https://doi.org/10.1117/12.435923
Status publikacji	Opublikowano - 2001
Wydarzenie	Optoelectronic and Electronic Sensors IV - Gliwice, Polska Czas trwania: 13 cze 2000 → 16 cze 2000

Obszary tematyczne ASJC Scopus

Materiały elektroniczne, optyczne i magnetyczne
Fizyka materii skondensowanej
Zastosowania informatyki
Matematyka stosowana
Inżynieria elektryczna i elektroniczna

Uzyskaj dostęp do dokumentu

10.1117/12.435923

Inne pliki i linki

Link do publikacji w Scopus

Cytowanie

@article{33c47242188842808b630401af6bf475,

title = "Application of dielectric layers made in sol-gel technique in the technology of planar waveguide sensors",

abstract = "The work discusses the application potentials of sol-gel technique in the technology of planar waveguide sensors. The capability to form refractive profiles with the use of various techniques applied in planar optics have been compared. The authors present the results of investigation studies involving the application of sol-gel technique of the oxide system SiO2:TiO2 for the formation of sensor layers, mask layers and waveguide layers. The influence of the thickness of waveguide layer and of its refractive index on the sensitivity of the meter measuring the refractive index changes and working in the difference interferometer system has been investigated.",

keywords = "Difference interferometer, Optical waveguide, Planar sensor, Sol-gel",

author = "P. Karasi{\'n}ski",

year = "2001",

doi = "10.1117/12.435923",

language = "English",

volume = "4516",

pages = "15--20",

journal = "Proceedings of SPIE - The International Society for Optical Engineering",

issn = "0277-786X",

publisher = "SPIE",

note = "Optoelectronic and Electronic Sensors IV ; Conference date: 13-06-2000 Through 16-06-2000",

}

TY - JOUR

T1 - Application of dielectric layers made in sol-gel technique in the technology of planar waveguide sensors

AU - Karasiński, P.

PY - 2001

Y1 - 2001

N2 - The work discusses the application potentials of sol-gel technique in the technology of planar waveguide sensors. The capability to form refractive profiles with the use of various techniques applied in planar optics have been compared. The authors present the results of investigation studies involving the application of sol-gel technique of the oxide system SiO2:TiO2 for the formation of sensor layers, mask layers and waveguide layers. The influence of the thickness of waveguide layer and of its refractive index on the sensitivity of the meter measuring the refractive index changes and working in the difference interferometer system has been investigated.

AB - The work discusses the application potentials of sol-gel technique in the technology of planar waveguide sensors. The capability to form refractive profiles with the use of various techniques applied in planar optics have been compared. The authors present the results of investigation studies involving the application of sol-gel technique of the oxide system SiO2:TiO2 for the formation of sensor layers, mask layers and waveguide layers. The influence of the thickness of waveguide layer and of its refractive index on the sensitivity of the meter measuring the refractive index changes and working in the difference interferometer system has been investigated.

KW - Difference interferometer

KW - Optical waveguide

KW - Planar sensor

KW - Sol-gel

UR - https://www.scopus.com/pages/publications/0034757265

U2 - 10.1117/12.435923

DO - 10.1117/12.435923

M3 - Conference article

AN - SCOPUS:0034757265

SN - 0277-786X

VL - 4516

SP - 15

EP - 20

JO - Proceedings of SPIE - The International Society for Optical Engineering

JF - Proceedings of SPIE - The International Society for Optical Engineering

T2 - Optoelectronic and Electronic Sensors IV

Y2 - 13 June 2000 through 16 June 2000

ER -

Application of dielectric layers made in sol-gel technique in the technology of planar waveguide sensors

Abstrakt

Obszary tematyczne ASJC Scopus

Uzyskaj dostęp do dokumentu

Inne pliki i linki

Fingerprint

Cytowanie