TY - GEN
T1 - Analog IC fault diagnosis by means of supply current monitoring in test points selected evolutionarily
AU - Golonek, Tomasz
AU - Grzechca, Damian
AU - Rutkowski, Jerzy
PY - 2010
Y1 - 2010
N2 - This paper describes the technique dedicated to an analog integrated circuit testing by means of supply current monitoring. The minimal set of test points, that allows to achieve the highest possible fault coverage, is determined with the use of genetic algorithm. Thanks to the proposed dynamic scheme of phenotype coding, the optimization process is more efficient than for a standard, static genotype structure realization.
AB - This paper describes the technique dedicated to an analog integrated circuit testing by means of supply current monitoring. The minimal set of test points, that allows to achieve the highest possible fault coverage, is determined with the use of genetic algorithm. Thanks to the proposed dynamic scheme of phenotype coding, the optimization process is more efficient than for a standard, static genotype structure realization.
UR - https://www.scopus.com/pages/publications/78649305409
M3 - Conference contribution
AN - SCOPUS:78649305409
SN - 9788390474342
T3 - International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceeding
SP - 397
EP - 400
BT - International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceedings
T2 - International Conference on Signals and Electronic Systems, ICSES'10
Y2 - 7 September 2010 through 10 September 2010
ER -