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The use of variable load for RF circuit testing

  • Silesian University of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

5 Citations (Scopus)

Abstract

The testing and diagnosis catastrophic faults technique for analog high frequency (HF) circuits (passive filters and impedance matching circuits) is described in this paper. The novel method based on load and frequency as testing pair has been proposed. The impact of load on testing and diagnostic has been investigated. The best pairs of load and frequency have been chosen. The proposed approach of testing analog HF circuits allows to increase diagnostic CUT with catastrophic faults and tolerance dispersion. The testing method has been checked for impedance matching circuit from RFID HF reader.

Original languageEnglish
Title of host publicationICSES'08 - ICSES 2008 International Conference on Signals and Electronic Systems, Proceedings
Pages557-560
Number of pages4
DOIs
Publication statusPublished - 2008
EventICSES 2008 International Conference on Signals and Electronic Systems, ICSES'08 - Krakow, Poland
Duration: 14 Sept 200817 Sept 2008

Publication series

NameICSES'08 - ICSES 2008 International Conference on Signals and Electronic Systems, Proceedings

Conference

ConferenceICSES 2008 International Conference on Signals and Electronic Systems, ICSES'08
Country/TerritoryPoland
CityKrakow
Period14/09/0817/09/08

Keywords

  • Impedance matching
  • RF testing
  • RFID

ASJC Scopus subject areas

  • Artificial Intelligence
  • Hardware and Architecture
  • Signal Processing
  • Electrical and Electronic Engineering

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