Abstract
Optical transmittance and reflectance of crystalline gallium selenide (GaSe) pallets of different thicknesses had been determined for various photon energies (from 1.1 to 2.8 eV) as well as for different polarisations and angles of incidence upon a sample. Fitting of these results with appropriate formulae allowed us to determine values of real parts of refractive indices at the surface as well as in the bulk of the investigated material. Also the values of absorption coefficients had been determined. Values of these parameters for light with the electric vector parallel and perpendicular to the c-axis of the GaSe had been evaluated. The absorption mechanism had been recognised and the values of direct and indirect energy gaps as well as exciton energies had been found by fitting the spectral dependencies of optical parameters.
| Original language | English |
|---|---|
| Pages (from-to) | 143-147 |
| Number of pages | 5 |
| Journal | Vacuum |
| Volume | 67 |
| Issue number | 1 |
| DOIs | |
| Publication status | Published - 2 Sept 2002 |
| Event | 2nd International Seminar On Semiconductor Surface Passivation (SSP'2001) - Ustron, Poland Duration: 10 Sept 2001 → 13 Sept 2001 |
Keywords
- Gallium selenide
- Interference spectroscopy of optical transmittance and reflectance
- Optical parameters
- Surface and bulk refractive indices
- VAR
ASJC Scopus subject areas
- Instrumentation
- Condensed Matter Physics
- Surfaces, Coatings and Films
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