Abstract
A simple interference spectroscopy technique of determining real parts of refractive indices in thin isotropic or anisotropic films is presented. This method is based on the evaluation of the orders of extrema in interference spectra of optical transmittance and/or reflectance measured for various angles of light incidence. It also makes possible to determine thickness of the investigated sample. This method of investigations was used to determine the parameters of gallium selenide (GaSe). The determined spectral characteristics of ordinary and extraordinary refractive indices of GaSe are compared with the data presented in literature by other authors.
| Original language | English |
|---|---|
| Pages (from-to) | 3792-3796 |
| Number of pages | 5 |
| Journal | Thin Solid Films |
| Volume | 517 |
| Issue number | 13 |
| DOIs | |
| Publication status | Published - 1 May 2009 |
Keywords
- Anisotropic materials
- Gallium selenide
- Refractive index
- Spectrogoniometry
- Thin films
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Surfaces and Interfaces
- Surfaces, Coatings and Films
- Metals and Alloys
- Materials Chemistry
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