Specialised excitation and wavelet feature extraction in fault diagnosis of analog electronic circuits

J. Rutkowski

doi:10.1109/ICECS.2008.4674836

Specialised excitation and wavelet feature extraction in fault diagnosis of analog electronic circuits

Chruszczyk
, J. Rutkowski

Department of Electronics; Electrical Engineering and Microelectronics (RAU/RAU11)

Silesian University of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

5 Citations (Scopus)

Abstract

This article presents design of specialised aperiodic excitation. Purpose is improvement of fault diagnosis of analog electronic circuits. The goal is enhancement of catastrophic (hard) faults location. Further improvement is achieved after utilising additional feature extraction by means of wavelet transform. Obtained results are compared to fault diagnosis without feature extraction and diagnosis with the simplest aperiodic excitation: step function.

Original language	English
Title of host publication	Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008
Pages	242-246
Number of pages	5
DOIs	https://doi.org/10.1109/ICECS.2008.4674836
Publication status	Published - 2008
Event	15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008 - St. Julian's, Malta Duration: 31 Aug 2008 → 3 Sept 2008

Publication series

Name	Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008

Conference

Conference	15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008
Country/Territory	Malta
City	St. Julian's
Period	31/08/08 → 3/09/08

ASJC Scopus subject areas

Electrical and Electronic Engineering

Access to Document

10.1109/ICECS.2008.4674836

Cite this

Chruszczyk, & Rutkowski, J. (2008). Specialised excitation and wavelet feature extraction in fault diagnosis of analog electronic circuits. In Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008 (pp. 242-246). Article 4674836 (Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008). https://doi.org/10.1109/ICECS.2008.4674836

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title = "Specialised excitation and wavelet feature extraction in fault diagnosis of analog electronic circuits",

abstract = "This article presents design of specialised aperiodic excitation. Purpose is improvement of fault diagnosis of analog electronic circuits. The goal is enhancement of catastrophic (hard) faults location. Further improvement is achieved after utilising additional feature extraction by means of wavelet transform. Obtained results are compared to fault diagnosis without feature extraction and diagnosis with the simplest aperiodic excitation: step function.",

author = "Chruszczyk and J. Rutkowski",

year = "2008",

doi = "10.1109/ICECS.2008.4674836",

language = "English",

isbn = "9781424421824",

series = "Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008",

pages = "242--246",

booktitle = "Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008",

note = "15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008 ; Conference date: 31-08-2008 Through 03-09-2008",

}

Chruszczyk & Rutkowski, J 2008, Specialised excitation and wavelet feature extraction in fault diagnosis of analog electronic circuits. in Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008., 4674836, Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008, pp. 242-246, 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008, St. Julian's, Malta, 31/08/08. https://doi.org/10.1109/ICECS.2008.4674836

Specialised excitation and wavelet feature extraction in fault diagnosis of analog electronic circuits. / Chruszczyk; Rutkowski, J.
Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008. 2008. p. 242-246 4674836 (Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

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AU - Chruszczyk,

AU - Rutkowski, J.

PY - 2008

Y1 - 2008

N2 - This article presents design of specialised aperiodic excitation. Purpose is improvement of fault diagnosis of analog electronic circuits. The goal is enhancement of catastrophic (hard) faults location. Further improvement is achieved after utilising additional feature extraction by means of wavelet transform. Obtained results are compared to fault diagnosis without feature extraction and diagnosis with the simplest aperiodic excitation: step function.

AB - This article presents design of specialised aperiodic excitation. Purpose is improvement of fault diagnosis of analog electronic circuits. The goal is enhancement of catastrophic (hard) faults location. Further improvement is achieved after utilising additional feature extraction by means of wavelet transform. Obtained results are compared to fault diagnosis without feature extraction and diagnosis with the simplest aperiodic excitation: step function.

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U2 - 10.1109/ICECS.2008.4674836

DO - 10.1109/ICECS.2008.4674836

M3 - Conference contribution

AN - SCOPUS:57849128131

SN - 9781424421824

T3 - Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008

SP - 242

EP - 246

BT - Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008

T2 - 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008

Y2 - 31 August 2008 through 3 September 2008

ER -

Chruszczyk, Rutkowski J. Specialised excitation and wavelet feature extraction in fault diagnosis of analog electronic circuits. In Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008. 2008. p. 242-246. 4674836. (Proceedings of the 15th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2008). doi: 10.1109/ICECS.2008.4674836

Specialised excitation and wavelet feature extraction in fault diagnosis of analog electronic circuits

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