Pełnofalowa analiza odporności elektroencefalografu na zaburzenia promieniowane

Artur Noga; Dariusz Wójcik; Maciej Surma

doi:10.15199/48.2018.02.17

Pełnofalowa analiza odporności elektroencefalografu na zaburzenia promieniowane

Translated title of the contribution: Full-wave numerical analysis of EEG device radiated immunity

Department of Electronics; Electrical Engineering and Microelectronics (RAU/RAU11)

Research output: Contribution to journal › Article › peer-review

1 Citation (Scopus)

Abstract

This paper illustrates numerical analysis of the EEG device radiated immunity. A realistic numerical model of the PCB of device under test with connected wires is developed. The structure is illuminated by a plane wave for different polarizations and directions of incidence. The main purpose of this study is to show the main coupling paths and influence of input filter elements on the level of induced radio-frequency noise voltage in the circuit.

Translated title of the contribution	Full-wave numerical analysis of EEG device radiated immunity
Original language	Polish
Pages (from-to)	70-73
Number of pages	4
Journal	Przeglad Elektrotechniczny
Volume	94
Issue number	2
DOIs	https://doi.org/10.15199/48.2018.02.17
Publication status	Published - 2018

ASJC Scopus subject areas

Electrical and Electronic Engineering

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10.15199/48.2018.02.17

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title = "Pe{\l}nofalowa analiza odporno{\'s}ci elektroencefalografu na zaburzenia promieniowane",

abstract = "This paper illustrates numerical analysis of the EEG device radiated immunity. A realistic numerical model of the PCB of device under test with connected wires is developed. The structure is illuminated by a plane wave for different polarizations and directions of incidence. The main purpose of this study is to show the main coupling paths and influence of input filter elements on the level of induced radio-frequency noise voltage in the circuit.",

keywords = "EEG device, Electromagnetic compatibility, Numerical analysis, Radiated immunity",

author = "Artur Noga and Dariusz W{\'o}jcik and Maciej Surma",

year = "2018",

doi = "10.15199/48.2018.02.17",

language = "polski",

volume = "94",

pages = "70--73",

journal = "Przeglad Elektrotechniczny",

issn = "0033-2097",

publisher = "Wydawnictwo SIGMA-NOT",

number = "2",

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AU - Noga, Artur

AU - Wójcik, Dariusz

AU - Surma, Maciej

PY - 2018

Y1 - 2018

N2 - This paper illustrates numerical analysis of the EEG device radiated immunity. A realistic numerical model of the PCB of device under test with connected wires is developed. The structure is illuminated by a plane wave for different polarizations and directions of incidence. The main purpose of this study is to show the main coupling paths and influence of input filter elements on the level of induced radio-frequency noise voltage in the circuit.

AB - This paper illustrates numerical analysis of the EEG device radiated immunity. A realistic numerical model of the PCB of device under test with connected wires is developed. The structure is illuminated by a plane wave for different polarizations and directions of incidence. The main purpose of this study is to show the main coupling paths and influence of input filter elements on the level of induced radio-frequency noise voltage in the circuit.

KW - EEG device

KW - Electromagnetic compatibility

KW - Numerical analysis

KW - Radiated immunity

UR - https://www.scopus.com/pages/publications/85041407587

U2 - 10.15199/48.2018.02.17

DO - 10.15199/48.2018.02.17

M3 - Artykuł

AN - SCOPUS:85041407587

SN - 0033-2097

VL - 94

SP - 70

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JO - Przeglad Elektrotechniczny

JF - Przeglad Elektrotechniczny

IS - 2

ER -

Pełnofalowa analiza odporności elektroencefalografu na zaburzenia promieniowane

Abstract

ASJC Scopus subject areas

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