Overview of metrics applicable in embedded systems functional testing

Rafal Kimla

doi:10.1063/5.0119761

Overview of metrics applicable in embedded systems functional testing

Rafal Kimla

Doctoral School (SD)

Power Control Business

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The black-box approach to embedded systems testing, also known as functional testing, requires a special set of metrics to be gathered in order to evaluate its outcome. This article presents the overview of the most common metrics that can assist in measuring the effectiveness of testing and that can be used to compare the different test methodologies or strategies.

Original language	English
Title of host publication	International Conference of Computational Methods in Sciences and Engineering, ICCMSE 2021
Editors	Theodore Simos, Theodore Simos, Theodore Simos, Charalambos Tsitouras, Zacharoula Kalogiratou, Theodore Monovasilis
Publisher	American Institute of Physics Inc.
ISBN (Electronic)	9780735442474
DOIs	https://doi.org/10.1063/5.0119761
Publication status	Published - 23 Nov 2022
Event	International Conference of Computational Methods in Sciences and Engineering 2021, ICCMSE 2021 - Heraklion, Greece Duration: 4 Sept 2021 → 7 Sept 2021

Publication series

Name	AIP Conference Proceedings
Volume	2611
ISSN (Print)	0094-243X
ISSN (Electronic)	1551-7616

Conference

Conference	International Conference of Computational Methods in Sciences and Engineering 2021, ICCMSE 2021
Country/Territory	Greece
City	Heraklion
Period	4/09/21 → 7/09/21

ASJC Scopus subject areas

General Physics and Astronomy

Access to Document

10.1063/5.0119761

Cite this

Kimla, R. (2022). Overview of metrics applicable in embedded systems functional testing. In T. Simos, T. Simos, T. Simos, C. Tsitouras, Z. Kalogiratou, & T. Monovasilis (Eds.), International Conference of Computational Methods in Sciences and Engineering, ICCMSE 2021 Article 070004 (AIP Conference Proceedings; Vol. 2611). American Institute of Physics Inc.. https://doi.org/10.1063/5.0119761

Kimla, Rafal. / Overview of metrics applicable in embedded systems functional testing. International Conference of Computational Methods in Sciences and Engineering, ICCMSE 2021. editor / Theodore Simos ; Theodore Simos ; Theodore Simos ; Charalambos Tsitouras ; Zacharoula Kalogiratou ; Theodore Monovasilis. American Institute of Physics Inc., 2022. (AIP Conference Proceedings).

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title = "Overview of metrics applicable in embedded systems functional testing",

abstract = "The black-box approach to embedded systems testing, also known as functional testing, requires a special set of metrics to be gathered in order to evaluate its outcome. This article presents the overview of the most common metrics that can assist in measuring the effectiveness of testing and that can be used to compare the different test methodologies or strategies.",

author = "Rafal Kimla",

note = "Publisher Copyright: {\textcopyright} 2022 Author(s).; International Conference of Computational Methods in Sciences and Engineering 2021, ICCMSE 2021 ; Conference date: 04-09-2021 Through 07-09-2021",

year = "2022",

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doi = "10.1063/5.0119761",

language = "English",

series = "AIP Conference Proceedings",

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editor = "Theodore Simos and Theodore Simos and Theodore Simos and Charalambos Tsitouras and Zacharoula Kalogiratou and Theodore Monovasilis",

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Kimla, R 2022, Overview of metrics applicable in embedded systems functional testing. in T Simos, T Simos, T Simos, C Tsitouras, Z Kalogiratou & T Monovasilis (eds), International Conference of Computational Methods in Sciences and Engineering, ICCMSE 2021., 070004, AIP Conference Proceedings, vol. 2611, American Institute of Physics Inc., International Conference of Computational Methods in Sciences and Engineering 2021, ICCMSE 2021, Heraklion, Greece, 4/09/21. https://doi.org/10.1063/5.0119761

Overview of metrics applicable in embedded systems functional testing. / Kimla, Rafal.
International Conference of Computational Methods in Sciences and Engineering, ICCMSE 2021. ed. / Theodore Simos; Theodore Simos; Theodore Simos; Charalambos Tsitouras; Zacharoula Kalogiratou; Theodore Monovasilis. American Institute of Physics Inc., 2022. 070004 (AIP Conference Proceedings; Vol. 2611).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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N2 - The black-box approach to embedded systems testing, also known as functional testing, requires a special set of metrics to be gathered in order to evaluate its outcome. This article presents the overview of the most common metrics that can assist in measuring the effectiveness of testing and that can be used to compare the different test methodologies or strategies.

AB - The black-box approach to embedded systems testing, also known as functional testing, requires a special set of metrics to be gathered in order to evaluate its outcome. This article presents the overview of the most common metrics that can assist in measuring the effectiveness of testing and that can be used to compare the different test methodologies or strategies.

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Overview of metrics applicable in embedded systems functional testing

Abstract

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