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Optimization of PWL analog testing excitation by means of genetic algorithm

  • Silesian University of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

11 Citations (Scopus)

Abstract

The method presented in this paper uses evolutionary computations to analog circuit testing stimulus shape optimization. The proposed testing excitation is a PWL wave-form that generates responses of the tested circuit with appropriate relationship between current values of its specifications and the value of the observed parameter. The energy of error signal between nominal and actually obtained responses is designated for the analyzed parameter. The fitness function applied to the evolutionary system allows to optimize the separation level of the identified circuit states and to improve linearity for relationship between the energy level and the circuit state.

Original languageEnglish
Title of host publicationICSES'08 - ICSES 2008 International Conference on Signals and Electronic Systems, Proceedings
Pages541-544
Number of pages4
DOIs
Publication statusPublished - 2008
EventICSES 2008 International Conference on Signals and Electronic Systems, ICSES'08 - Krakow, Poland
Duration: 14 Sept 200817 Sept 2008

Publication series

NameICSES'08 - ICSES 2008 International Conference on Signals and Electronic Systems, Proceedings

Conference

ConferenceICSES 2008 International Conference on Signals and Electronic Systems, ICSES'08
Country/TerritoryPoland
CityKrakow
Period14/09/0817/09/08

Keywords

  • Analog circuit testing
  • Genetic algorithm
  • Genotype
  • PWL testing stimulus
  • Phenotype

ASJC Scopus subject areas

  • Artificial Intelligence
  • Hardware and Architecture
  • Signal Processing
  • Electrical and Electronic Engineering

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