Abstract
The article addresses the issues related to the Double Pulse Test (DPT) used to determine the dynamic properties of SiC MOSFET transistors. The DPT method is characterized, with particular attention given to the methods of time synchronization for voltage and current measurement probes. To ensure proper synchronization, the automation of the method for reconstructing the transistor voltage based on the measured current is proposed, and a new, analogous method for reconstructing the transistor current using the recorded voltage is described.
| Translated title of the contribution | Metody synchronizacji czasowej sond pomiarowych do testu dwupulsowego (DPT) tranzystorów SiC MOSFET |
|---|---|
| Original language | English |
| Pages (from-to) | 156-165 |
| Number of pages | 10 |
| Journal | Przeglad Elektrotechniczny |
| Volume | 102 |
| Issue number | 3 |
| DOIs | |
| Publication status | Published - 2026 |
Keywords
- determining switching energies
- double pulse test (DPT)
- oscilloscope measurements
- SiC MOSFET
ASJC Scopus subject areas
- Electrical and Electronic Engineering
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