Abstract
A measuring assembly to examine the distribution of light intensity in near field of planar and strip waveguides was presented. The image of near-field intensity distribution of waveguide modes was showed as well as their interferrential changes caused by the change in optic features of waveguide structure. The presented version of the station was the one to measure the power guided in particular modes with the same polarisation states.
| Original language | English |
|---|---|
| Pages (from-to) | 192-198 |
| Number of pages | 7 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 4239 |
| DOIs | |
| Publication status | Published - 2000 |
Keywords
- Difference interferometer
- Near-field intensity
- Optoelectronical didactics
- Planar waveguides
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
Fingerprint
Dive into the research topics of 'Measuring system to registration of near field power distribution in modes of planar and strip waveguides'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver