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Local polynomial model: A new approach to vignetting correction

  • Silesian University of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

8 Citations (Scopus)

Abstract

The vignetting refers to the fall-off of pixel intensity from the center towards the edges of the image. The correction of vignetting is a required pre-processing step in many applications of machine vision. In this paper, we propose a new local polynomial model of vignetting. The order of the polynomial is a parameter of the model and allows to fit the model to the real vignetting of the camera-lens system. The novelty of the proposed model is a usage of local fitting of the model to vignetting data, in contrast to the global models described in the literature. The new model was tested on two camera-lens systems with radial and non-radial vignetting, and has been compared with methods known from the literature. Based on the obtained results the proposed model gives the best quality of vignetting correction among the tested models of vignetting.

Original languageEnglish
Title of host publicationNinth International Conference on Machine Vision, ICMV 2016
EditorsDmitry P. Nikolaev, Antanas Verikas, Jianhong Zhou, Petia Radeva, Wei Zhang
PublisherSPIE
ISBN (Electronic)9781510611313
DOIs
Publication statusPublished - 2017
Event9th International Conference on Machine Vision, ICMV 2016 - Nice, France
Duration: 18 Nov 201620 Nov 2016

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume10341
ISSN (Print)0277-786X
ISSN (Electronic)1996-756X

Conference

Conference9th International Conference on Machine Vision, ICMV 2016
Country/TerritoryFrance
CityNice
Period18/11/1620/11/16

Keywords

  • Vignetting correction
  • approximation function
  • image entropy.
  • vignetting modeling

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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