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Keypoint-based metric for evaluating image super-resolution quality

  • Silesian University of Technology
  • KP Labs Spółka z ograniczoną odpowiedzialnością
  • Warsaw University of Technology

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Abstract

Recent advances in single- and multi-image super-resolution have revealed the limitations of classical image similarity metrics (like peak signal-to-noise ratio), as they often fail to align with human perception when evaluating the visual quality of super-resolved outputs. In this paper, we explore how to exploit keypoint-based metrics to evaluate super-resolution image quality. Specifically, we explore two correlated metrics: (i) a multiscale index proposal measure capturing salience of keypoints, and (ii) a repeatability metric quantifying how consistently the corresponding keypoints are identified in super-resolved and ground-truth images. Experiments on several simulated and real-world datasets show that the repeatability correlates with subjective judgments, and multi-scale index proposal can be helpful for difficult datasets when other metrics are insufficient.

Original languageEnglish
Title of host publicationProceedings of the 20th Conference on Computer Science and Intelligence Systems, FedCSIS 2025
EditorsMarek Bolanowski, Maria Ganzha, Leszek A. Maciaszek, Leszek A. Maciaszek, Marcin Paprzycki, Dominik Slezak
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages255-263
Number of pages9
Edition2025
ISBN (Electronic)9788397329164
DOIs
Publication statusPublished - 2025
Event20th Conference on Computer Science and Intelligence Systems, FedCSIS 2025 - Krakow, Poland
Duration: 14 Sept 202517 Sept 2025

Conference

Conference20th Conference on Computer Science and Intelligence Systems, FedCSIS 2025
Country/TerritoryPoland
CityKrakow
Period14/09/2517/09/25

ASJC Scopus subject areas

  • Artificial Intelligence
  • Computer Science Applications
  • Information Systems
  • Information Systems and Management

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