Abstract
Recent advances in single- and multi-image super-resolution have revealed the limitations of classical image similarity metrics (like peak signal-to-noise ratio), as they often fail to align with human perception when evaluating the visual quality of super-resolved outputs. In this paper, we explore how to exploit keypoint-based metrics to evaluate super-resolution image quality. Specifically, we explore two correlated metrics: (i) a multiscale index proposal measure capturing salience of keypoints, and (ii) a repeatability metric quantifying how consistently the corresponding keypoints are identified in super-resolved and ground-truth images. Experiments on several simulated and real-world datasets show that the repeatability correlates with subjective judgments, and multi-scale index proposal can be helpful for difficult datasets when other metrics are insufficient.
| Original language | English |
|---|---|
| Title of host publication | Proceedings of the 20th Conference on Computer Science and Intelligence Systems, FedCSIS 2025 |
| Editors | Marek Bolanowski, Maria Ganzha, Leszek A. Maciaszek, Leszek A. Maciaszek, Marcin Paprzycki, Dominik Slezak |
| Publisher | Institute of Electrical and Electronics Engineers Inc. |
| Pages | 255-263 |
| Number of pages | 9 |
| Edition | 2025 |
| ISBN (Electronic) | 9788397329164 |
| DOIs | |
| Publication status | Published - 2025 |
| Event | 20th Conference on Computer Science and Intelligence Systems, FedCSIS 2025 - Krakow, Poland Duration: 14 Sept 2025 → 17 Sept 2025 |
Conference
| Conference | 20th Conference on Computer Science and Intelligence Systems, FedCSIS 2025 |
|---|---|
| Country/Territory | Poland |
| City | Krakow |
| Period | 14/09/25 → 17/09/25 |
ASJC Scopus subject areas
- Artificial Intelligence
- Computer Science Applications
- Information Systems
- Information Systems and Management
Fingerprint
Dive into the research topics of 'Keypoint-based metric for evaluating image super-resolution quality'. Together they form a unique fingerprint.Cite this
- APA
- Author
- BIBTEX
- Harvard
- Standard
- RIS
- Vancouver