Abstract
The high‐frequency method of investigation of PME and PC effects is used for the measurements on silicon samples of different thickness. A method for testing the conformity of thick or thin samples, a theory to work out the experimental results is reported. An application of the acoustooptical modulation of a laser beam to the investigation of PME and PC effects is presented.
| Original language | English |
|---|---|
| Pages (from-to) | 447-451 |
| Number of pages | 5 |
| Journal | Physica Status Solidi (A) Applied Research |
| Volume | 65 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - 16 Jun 1981 |
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
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