Global parametric faults identification with the use of differential evolution

P. Jantos; D. Grzechca; J. Rutkowski

doi:10.1109/DDECS.2009.5012133

Global parametric faults identification with the use of differential evolution

P. Jantos
, D. Grzechca
, J. Rutkowski

Department of Electronics; Electrical Engineering and Microelectronics (RAU/RAU11)

Silesian University of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

5 Citations (Scopus)

Abstract

This paper presents a novel method to a multiple parametric faults diagnosis (global parametric faults - GPF) in analogue integrated circuits (AIC). The method is based on features of AIC time domain response to voltage step excitation, i.e. AIC response and its first order derivative maxima and minima locations. A circuit states classification is acquired with the use of linear evolutionary classifier which parameters are determined with the use of Differential Evolution. Selected AIC response features distributions are approximated with geometric figures based on polynomial functions. The proposed diagnosis method has been applied for a GPF diagnosis in an exemplary integrated circuit - operational amplifier μA741.

Original language	English
Title of host publication	Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009
Pages	222-225
Number of pages	4
DOIs	https://doi.org/10.1109/DDECS.2009.5012133
Publication status	Published - 2009
Event	2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009 - Liberec, Czech Republic Duration: 15 Apr 2009 → 17 Apr 2009

Publication series

Name	Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009

Conference

Conference	2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009
Country/Territory	Czech Republic
City	Liberec
Period	15/04/09 → 17/04/09

ASJC Scopus subject areas

Hardware and Architecture
Control and Systems Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/DDECS.2009.5012133

Cite this

Jantos, P., Grzechca, D., & Rutkowski, J. (2009). Global parametric faults identification with the use of differential evolution. In Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009 (pp. 222-225). Article 5012133 (Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009). https://doi.org/10.1109/DDECS.2009.5012133

Jantos, P. ; Grzechca, D. ; Rutkowski, J. / Global parametric faults identification with the use of differential evolution. Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009. 2009. pp. 222-225 (Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009).

@inproceedings{929cb8c64e824175b0f409a04b70c547,

title = "Global parametric faults identification with the use of differential evolution",

abstract = "This paper presents a novel method to a multiple parametric faults diagnosis (global parametric faults - GPF) in analogue integrated circuits (AIC). The method is based on features of AIC time domain response to voltage step excitation, i.e. AIC response and its first order derivative maxima and minima locations. A circuit states classification is acquired with the use of linear evolutionary classifier which parameters are determined with the use of Differential Evolution. Selected AIC response features distributions are approximated with geometric figures based on polynomial functions. The proposed diagnosis method has been applied for a GPF diagnosis in an exemplary integrated circuit - operational amplifier μA741.",

author = "P. Jantos and D. Grzechca and J. Rutkowski",

year = "2009",

doi = "10.1109/DDECS.2009.5012133",

language = "English",

isbn = "9781424433391",

series = "Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009",

pages = "222--225",

booktitle = "Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009",

note = "2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009 ; Conference date: 15-04-2009 Through 17-04-2009",

}

Jantos, P, Grzechca, D & Rutkowski, J 2009, Global parametric faults identification with the use of differential evolution. in Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009., 5012133, Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009, pp. 222-225, 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009, Liberec, Czech Republic, 15/04/09. https://doi.org/10.1109/DDECS.2009.5012133

Global parametric faults identification with the use of differential evolution. / Jantos, P.; Grzechca, D.; Rutkowski, J.
Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009. 2009. p. 222-225 5012133 (Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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N2 - This paper presents a novel method to a multiple parametric faults diagnosis (global parametric faults - GPF) in analogue integrated circuits (AIC). The method is based on features of AIC time domain response to voltage step excitation, i.e. AIC response and its first order derivative maxima and minima locations. A circuit states classification is acquired with the use of linear evolutionary classifier which parameters are determined with the use of Differential Evolution. Selected AIC response features distributions are approximated with geometric figures based on polynomial functions. The proposed diagnosis method has been applied for a GPF diagnosis in an exemplary integrated circuit - operational amplifier μA741.

AB - This paper presents a novel method to a multiple parametric faults diagnosis (global parametric faults - GPF) in analogue integrated circuits (AIC). The method is based on features of AIC time domain response to voltage step excitation, i.e. AIC response and its first order derivative maxima and minima locations. A circuit states classification is acquired with the use of linear evolutionary classifier which parameters are determined with the use of Differential Evolution. Selected AIC response features distributions are approximated with geometric figures based on polynomial functions. The proposed diagnosis method has been applied for a GPF diagnosis in an exemplary integrated circuit - operational amplifier μA741.

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T3 - Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009

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BT - Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009

T2 - 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009

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ER -

Jantos P, Grzechca D, Rutkowski J. Global parametric faults identification with the use of differential evolution. In Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009. 2009. p. 222-225. 5012133. (Proceedings of the 2009 IEEE Symposium on Design and Diagnostics of Electronic Circuits and Systems, DDECS 2009). doi: 10.1109/DDECS.2009.5012133

Global parametric faults identification with the use of differential evolution

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