Abstract
A new approach to an optimal analog test points selection is proposed. The described method uses ambiguity set concept and evolutionary computations to determine the optimal set of analog test points. After a brief introduction to analog testing and genetic algorithms, the proposed strategy is explained. The presented evolutionary approach is illustrated by a practical example of analog circuit and by a series of hypothetical circuits. The efficiency of the technique is compared with a method based on entropy index, and the obtained results are discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 117-121 |
| Number of pages | 5 |
| Journal | IEEE Transactions on Circuits and Systems II: Express Briefs |
| Volume | 54 |
| Issue number | 2 |
| DOIs | |
| Publication status | Published - Feb 2007 |
Keywords
- Analog circuits
- analog system testing
- design for testability (DfT)
- genetic algorithms (GAs)
ASJC Scopus subject areas
- Electrical and Electronic Engineering
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