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Fringe pattern field analysis in planar waveguides investigation

  • Silesian University of Technology

Research output: Contribution to journalConference articlepeer-review

Abstract

A fringe pattern field was analyzed to determine the profile of refractive index of planar waveguides. The refractive profiles of planar waveguides produced in the soda-lime glass by using an ion exchange Ag+↔Na+ were also examined. It was shown that the mode spectra during synchronous angle measurements were very dense.

Original languageEnglish
Pages (from-to)165-170
Number of pages6
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3320
DOIs
Publication statusPublished - 1996
EventProceedings of the 1997 10th Slovak-Czsch-Polish Optical Conference on Wave and Quantum Aspects of Contemporary Optics - Karpacz, Poland
Duration: 16 Sept 199620 Sept 1996

Keywords

  • Gradient planar waveguides
  • Ion exchange in glasses
  • Refractive index measurements

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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