TY - GEN
T1 - Faults classification in analog electronic circuits with use of the SVM algorithm
AU - Grzechca, Damian
AU - Czeczótka, Sławomir
PY - 2009
Y1 - 2009
N2 - In the paper the application of the SVM (Support Vector Machine) algorithm has been used for diagnosis and test of analog electronic circuits in time domain. Procedure designed belongs to simulation before test technique, where the fault models should be assumed at the before test stage (prototype stage). Both, parametric and catastrophic faults based on standard fault models are considered. Selected features from transient domain are classified at the after test stage with use of decision function, which has been designed by SVM algorithm. An exemplary benchmark has been tested and the results prove high classification ability of the SVM application.
AB - In the paper the application of the SVM (Support Vector Machine) algorithm has been used for diagnosis and test of analog electronic circuits in time domain. Procedure designed belongs to simulation before test technique, where the fault models should be assumed at the before test stage (prototype stage). Both, parametric and catastrophic faults based on standard fault models are considered. Selected features from transient domain are classified at the after test stage with use of decision function, which has been designed by SVM algorithm. An exemplary benchmark has been tested and the results prove high classification ability of the SVM application.
UR - https://www.scopus.com/pages/publications/71249157327
U2 - 10.1109/ECCTD.2009.5275061
DO - 10.1109/ECCTD.2009.5275061
M3 - Conference contribution
AN - SCOPUS:71249157327
SN - 9781424438969
T3 - ECCTD 2009 - European Conference on Circuit Theory and Design Conference Program
SP - 659
EP - 662
BT - ECCTD 2009 - European Conference on Circuit Theory and Design Conference Program
T2 - ECCTD 2009 - European Conference on Circuit Theory and Design Conference Program
Y2 - 23 August 2009 through 27 August 2009
ER -