Extension of the boundary-scan architecture and new idea of bist for more effective testing and self-testing of interconnections

Adam Kristof

doi:10.1109/edtc.1997.582443

Extension of the boundary-scan architecture and new idea of bist for more effective testing and self-testing of interconnections

Adam Kristof

Department of Automatic Control and Robotics (RAU/RAU3)

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

The approach presented in this paper enables more effective testing of on-board and board-to-board interconnections and significantly simplifies the interconnection self-testing. Some extensions must be added to the Boundary Scan Architecture which however do not violate the JTAG/IEEE 1149.1 standard requirements. Benefits are the reduced complexity and cost of an on-board testing unit as well as better test performance.

Original language	English
Title of host publication	Proceedings - European Conference on Design and Test, ED and TC 1997
Publisher	Association for Computing Machinery
Pages	630
Number of pages	1
ISBN (Electronic)	0818677864, 9780818677861
DOIs	https://doi.org/10.1109/edtc.1997.582443
Publication status	Published - 17 Mar 1997
Event	1997 European Conference on Design and Test, ED and TC 1997 - Paris, France Duration: 17 Mar 1997 → 20 Mar 1997

Publication series

Name	Proceedings of the 1997 European Conference on Design and Test, EDTC 1997

Conference

Conference	1997 European Conference on Design and Test, ED and TC 1997
Country/Territory	France
City	Paris
Period	17/03/97 → 20/03/97

ASJC Scopus subject areas

Control and Systems Engineering
General Computer Science

Access to Document

10.1109/edtc.1997.582443

Cite this

Kristof, A. (1997). Extension of the boundary-scan architecture and new idea of bist for more effective testing and self-testing of interconnections. In Proceedings - European Conference on Design and Test, ED and TC 1997 (pp. 630). (Proceedings of the 1997 European Conference on Design and Test, EDTC 1997). Association for Computing Machinery. https://doi.org/10.1109/edtc.1997.582443

@inproceedings{b0a4d51f57504f41a1836b2cfb1be780,

title = "Extension of the boundary-scan architecture and new idea of bist for more effective testing and self-testing of interconnections",

abstract = "The approach presented in this paper enables more effective testing of on-board and board-to-board interconnections and significantly simplifies the interconnection self-testing. Some extensions must be added to the Boundary Scan Architecture which however do not violate the JTAG/IEEE 1149.1 standard requirements. Benefits are the reduced complexity and cost of an on-board testing unit as well as better test performance.",

author = "Adam Kristof",

note = "Publisher Copyright: {\textcopyright} 1997 IEEE.; 1997 European Conference on Design and Test, ED and TC 1997 ; Conference date: 17-03-1997 Through 20-03-1997",

year = "1997",

month = mar,

day = "17",

doi = "10.1109/edtc.1997.582443",

language = "English",

series = "Proceedings of the 1997 European Conference on Design and Test, EDTC 1997",

publisher = "Association for Computing Machinery",

pages = "630",

booktitle = "Proceedings - European Conference on Design and Test, ED and TC 1997",

address = "United States",

}

Kristof, A 1997, Extension of the boundary-scan architecture and new idea of bist for more effective testing and self-testing of interconnections. in Proceedings - European Conference on Design and Test, ED and TC 1997. Proceedings of the 1997 European Conference on Design and Test, EDTC 1997, Association for Computing Machinery, pp. 630, 1997 European Conference on Design and Test, ED and TC 1997, Paris, France, 17/03/97. https://doi.org/10.1109/edtc.1997.582443

Extension of the boundary-scan architecture and new idea of bist for more effective testing and self-testing of interconnections. / Kristof, Adam.
Proceedings - European Conference on Design and Test, ED and TC 1997. Association for Computing Machinery, 1997. p. 630 (Proceedings of the 1997 European Conference on Design and Test, EDTC 1997).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Extension of the boundary-scan architecture and new idea of bist for more effective testing and self-testing of interconnections

AU - Kristof, Adam

PY - 1997/3/17

Y1 - 1997/3/17

N2 - The approach presented in this paper enables more effective testing of on-board and board-to-board interconnections and significantly simplifies the interconnection self-testing. Some extensions must be added to the Boundary Scan Architecture which however do not violate the JTAG/IEEE 1149.1 standard requirements. Benefits are the reduced complexity and cost of an on-board testing unit as well as better test performance.

AB - The approach presented in this paper enables more effective testing of on-board and board-to-board interconnections and significantly simplifies the interconnection self-testing. Some extensions must be added to the Boundary Scan Architecture which however do not violate the JTAG/IEEE 1149.1 standard requirements. Benefits are the reduced complexity and cost of an on-board testing unit as well as better test performance.

UR - https://www.scopus.com/pages/publications/85029617221

U2 - 10.1109/edtc.1997.582443

DO - 10.1109/edtc.1997.582443

M3 - Conference contribution

AN - SCOPUS:85029617221

T3 - Proceedings of the 1997 European Conference on Design and Test, EDTC 1997

SP - 630

BT - Proceedings - European Conference on Design and Test, ED and TC 1997

PB - Association for Computing Machinery

T2 - 1997 European Conference on Design and Test, ED and TC 1997

Y2 - 17 March 1997 through 20 March 1997

ER -

Kristof A. Extension of the boundary-scan architecture and new idea of bist for more effective testing and self-testing of interconnections. In Proceedings - European Conference on Design and Test, ED and TC 1997. Association for Computing Machinery. 1997. p. 630. (Proceedings of the 1997 European Conference on Design and Test, EDTC 1997). doi: 10.1109/edtc.1997.582443

Extension of the boundary-scan architecture and new idea of bist for more effective testing and self-testing of interconnections

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