Excitation optimization in fault diagnosis of analog electronic circuits

J. Rutkowski

doi:10.1109/DDECS.2008.4538802

Excitation optimization in fault diagnosis of analog electronic circuits

Chruszczyk
, J. Rutkowski

Department of Electronics; Electrical Engineering and Microelectronics (RAU/RAU11)

Silesian University of Technology

Research output: Contribution to conference › Paper › peer-review

6 Citations (Scopus)

Abstract

This article describes optimization of excitation signal for purpose of fault diagnosis. The goal is to enhance efficiency of faults detection in analog electronic circuits. The method has been verified on cases with single hard (catastrophic) and soft (parametric) faults. Further enhancement of fault detection efficiency has been achieved with additional feature extraction by means of wavelet transform. Obtained results have been compared with diagnosis using step function excitation and diagnosis without feature extraction.

Original language	English
Pages	279-282
Number of pages	4
DOIs	https://doi.org/10.1109/DDECS.2008.4538802
Publication status	Published - 2008
Event	2008 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS - Bratislava, Slovakia Duration: 16 Apr 2008 → 18 Apr 2008

Conference

Conference	2008 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS
Country/Territory	Slovakia
City	Bratislava
Period	16/04/08 → 18/04/08

ASJC Scopus subject areas

Electrical and Electronic Engineering
Control and Systems Engineering

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10.1109/DDECS.2008.4538802

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title = "Excitation optimization in fault diagnosis of analog electronic circuits",

abstract = "This article describes optimization of excitation signal for purpose of fault diagnosis. The goal is to enhance efficiency of faults detection in analog electronic circuits. The method has been verified on cases with single hard (catastrophic) and soft (parametric) faults. Further enhancement of fault detection efficiency has been achieved with additional feature extraction by means of wavelet transform. Obtained results have been compared with diagnosis using step function excitation and diagnosis without feature extraction.",

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language = "English",

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AB - This article describes optimization of excitation signal for purpose of fault diagnosis. The goal is to enhance efficiency of faults detection in analog electronic circuits. The method has been verified on cases with single hard (catastrophic) and soft (parametric) faults. Further enhancement of fault detection efficiency has been achieved with additional feature extraction by means of wavelet transform. Obtained results have been compared with diagnosis using step function excitation and diagnosis without feature extraction.

UR - https://www.scopus.com/pages/publications/50649099268

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DO - 10.1109/DDECS.2008.4538802

M3 - Paper

AN - SCOPUS:50649099268

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T2 - 2008 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS

Y2 - 16 April 2008 through 18 April 2008

ER -

Excitation optimization in fault diagnosis of analog electronic circuits

Abstract

Conference

ASJC Scopus subject areas

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