Evolutionary system for analog test frequencies selection with fuzzy initialization

T. Golonek; D. Grzechca; J. Rutkowski

doi:10.1109/DDECS.2007.4295311

Evolutionary system for analog test frequencies selection with fuzzy initialization

T. Golonek
, D. Grzechca
, J. Rutkowski

Department of Electronics; Electrical Engineering and Microelectronics (RAU/RAU11)

Silesian University of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

3 Citations (Scopus)

Abstract

The evolutionary technique of test frequencies selection for analog sinusoidal stimuli set is described in this paper. The proposed method bases on ambiguity set concept and evolutionary algorithm that has been executed for fuzzy and weighted fitness functions. The proposed approach to analog testing allows to achieve high efficiency for practical circuits under test with tolerance dispersions and test inaccuracies presence. Optimization system has been implemented with the use of the MicroBlaze embedded processor on Virtex4 ML-401 platform.

Original language	English
Title of host publication	Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS
Pages	353-356
Number of pages	4
DOIs	https://doi.org/10.1109/DDECS.2007.4295311
Publication status	Published - 2007
Event	2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS - Krakow, Poland Duration: 11 Apr 2007 → 13 Apr 2007

Publication series

Name	Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS

Conference

Conference	2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS
Country/Territory	Poland
City	Krakow
Period	11/04/07 → 13/04/07

Keywords

Ambiguity set
Analog testing
Embedded system
Evolutionary computations
Fuzzy sets

ASJC Scopus subject areas

Control and Systems Engineering
Electrical and Electronic Engineering

Access to Document

10.1109/DDECS.2007.4295311

Cite this

Golonek, T., Grzechca, D., & Rutkowski, J. (2007). Evolutionary system for analog test frequencies selection with fuzzy initialization. In Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS (pp. 353-356). Article 4295311 (Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS). https://doi.org/10.1109/DDECS.2007.4295311

@inproceedings{2065363997244fcf9b3217730fb5716d,

title = "Evolutionary system for analog test frequencies selection with fuzzy initialization",

abstract = "The evolutionary technique of test frequencies selection for analog sinusoidal stimuli set is described in this paper. The proposed method bases on ambiguity set concept and evolutionary algorithm that has been executed for fuzzy and weighted fitness functions. The proposed approach to analog testing allows to achieve high efficiency for practical circuits under test with tolerance dispersions and test inaccuracies presence. Optimization system has been implemented with the use of the MicroBlaze embedded processor on Virtex4 ML-401 platform.",

keywords = "Ambiguity set, Analog testing, Embedded system, Evolutionary computations, Fuzzy sets",

author = "T. Golonek and D. Grzechca and J. Rutkowski",

year = "2007",

doi = "10.1109/DDECS.2007.4295311",

language = "English",

isbn = "1424411610",

series = "Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS",

pages = "353--356",

booktitle = "Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS",

note = "2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS ; Conference date: 11-04-2007 Through 13-04-2007",

}

Golonek, T , Grzechca, D & Rutkowski, J 2007, Evolutionary system for analog test frequencies selection with fuzzy initialization. in Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS., 4295311, Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS, pp. 353-356, 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS, Krakow, Poland, 11/04/07. https://doi.org/10.1109/DDECS.2007.4295311

Evolutionary system for analog test frequencies selection with fuzzy initialization. / Golonek, T.; Grzechca, D.; Rutkowski, J.
Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS. 2007. p. 353-356 4295311 (Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - Evolutionary system for analog test frequencies selection with fuzzy initialization

AU - Golonek, T.

AU - Grzechca, D.

AU - Rutkowski, J.

PY - 2007

Y1 - 2007

N2 - The evolutionary technique of test frequencies selection for analog sinusoidal stimuli set is described in this paper. The proposed method bases on ambiguity set concept and evolutionary algorithm that has been executed for fuzzy and weighted fitness functions. The proposed approach to analog testing allows to achieve high efficiency for practical circuits under test with tolerance dispersions and test inaccuracies presence. Optimization system has been implemented with the use of the MicroBlaze embedded processor on Virtex4 ML-401 platform.

AB - The evolutionary technique of test frequencies selection for analog sinusoidal stimuli set is described in this paper. The proposed method bases on ambiguity set concept and evolutionary algorithm that has been executed for fuzzy and weighted fitness functions. The proposed approach to analog testing allows to achieve high efficiency for practical circuits under test with tolerance dispersions and test inaccuracies presence. Optimization system has been implemented with the use of the MicroBlaze embedded processor on Virtex4 ML-401 platform.

KW - Ambiguity set

KW - Analog testing

KW - Embedded system

KW - Evolutionary computations

KW - Fuzzy sets

UR - https://www.scopus.com/pages/publications/42149133713

U2 - 10.1109/DDECS.2007.4295311

DO - 10.1109/DDECS.2007.4295311

M3 - Conference contribution

AN - SCOPUS:42149133713

SN - 1424411610

SN - 9781424411610

T3 - Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS

SP - 353

EP - 356

BT - Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS

T2 - 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS

Y2 - 11 April 2007 through 13 April 2007

ER -

Golonek T , Grzechca D, Rutkowski J. Evolutionary system for analog test frequencies selection with fuzzy initialization. In Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS. 2007. p. 353-356. 4295311. (Proceedings of the 2007 IEEE Workshop on Design and Diagnostics of Electronic Circuits and Systems, DDECS). doi: 10.1109/DDECS.2007.4295311

Evolutionary system for analog test frequencies selection with fuzzy initialization

Abstract

Publication series

Conference

Keywords

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this