Electrical and optical properties of spin-coated SnO2 nanofilms

Weronika Izydorczyk; Krzysztof Waczyński; Jacek Izydorczyk; Pawel Karasiński; Janusz Mazurkiewicz; Miroslaw Magnuski; Jerzy Uljanow; Natalia Waczyń Skaniemiec; Wojciech Filipowski

doi:10.2478/s13536-014-0265-2

Electrical and optical properties of spin-coated SnO₂ nanofilms

Weronika Izydorczyk
, Krzysztof Waczyński
, Jacek Izydorczyk
, Pawel Karasiński
, Janusz Mazurkiewicz
, Miroslaw Magnuski
, Jerzy Uljanow
, Natalia Waczyń Skaniemiec
, Wojciech Filipowski

Silesian University of Technology

Research output: Contribution to journal › Article › peer-review

7 Citations (Scopus)

Abstract

SnO₂ nanocrystalline thin films have been deposited on oxidized silicon substrates by spin-coating from a precursor solution, followed by slow thermal annealing in oxygen atmosphere at different temperatures (500 to 900 °C). The precursor solution consisted of 1.0 to 2.0 M SnCl₄·5H₂O in isopropanol. It was shown that the concentration of the precursor solution, annealing temperature and heating rate had a significant effect on the structural, optical and electrical properties of the studied thin films. The topography of SnO₂ thin films was examined by scanning electron microscopy (SEM). Furthermore, as-deposited films were characterized by X-ray diffraction (XRD), UV-Vis and impedance spectroscopy.

Original language	English
Pages (from-to)	729-736
Number of pages	8
Journal	Materials Science-Poland
Volume	32
Issue number	4
DOIs	https://doi.org/10.2478/s13536-014-0265-2
Publication status	Published - 1 Dec 2014

Keywords

Spin-coating
Tin dioxide
UV-Vis spectroscopy
X-ray diffraction

ASJC Scopus subject areas

General Materials Science
Condensed Matter Physics
Mechanics of Materials
Mechanical Engineering

Access to Document

10.2478/s13536-014-0265-2

Cite this

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title = "Electrical and optical properties of spin-coated SnO2 nanofilms",

abstract = "SnO2 nanocrystalline thin films have been deposited on oxidized silicon substrates by spin-coating from a precursor solution, followed by slow thermal annealing in oxygen atmosphere at different temperatures (500 to 900 °C). The precursor solution consisted of 1.0 to 2.0 M SnCl4·5H2O in isopropanol. It was shown that the concentration of the precursor solution, annealing temperature and heating rate had a significant effect on the structural, optical and electrical properties of the studied thin films. The topography of SnO2 thin films was examined by scanning electron microscopy (SEM). Furthermore, as-deposited films were characterized by X-ray diffraction (XRD), UV-Vis and impedance spectroscopy.",

keywords = "Spin-coating, Tin dioxide, UV-Vis spectroscopy, X-ray diffraction",

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T1 - Electrical and optical properties of spin-coated SnO2 nanofilms

AU - Izydorczyk, Weronika

AU - Waczyński, Krzysztof

AU - Izydorczyk, Jacek

AU - Karasiński, Pawel

AU - Mazurkiewicz, Janusz

AU - Magnuski, Miroslaw

AU - Uljanow, Jerzy

AU - Skaniemiec, Natalia Waczyń

AU - Filipowski, Wojciech

PY - 2014/12/1

Y1 - 2014/12/1

N2 - SnO2 nanocrystalline thin films have been deposited on oxidized silicon substrates by spin-coating from a precursor solution, followed by slow thermal annealing in oxygen atmosphere at different temperatures (500 to 900 °C). The precursor solution consisted of 1.0 to 2.0 M SnCl4·5H2O in isopropanol. It was shown that the concentration of the precursor solution, annealing temperature and heating rate had a significant effect on the structural, optical and electrical properties of the studied thin films. The topography of SnO2 thin films was examined by scanning electron microscopy (SEM). Furthermore, as-deposited films were characterized by X-ray diffraction (XRD), UV-Vis and impedance spectroscopy.

AB - SnO2 nanocrystalline thin films have been deposited on oxidized silicon substrates by spin-coating from a precursor solution, followed by slow thermal annealing in oxygen atmosphere at different temperatures (500 to 900 °C). The precursor solution consisted of 1.0 to 2.0 M SnCl4·5H2O in isopropanol. It was shown that the concentration of the precursor solution, annealing temperature and heating rate had a significant effect on the structural, optical and electrical properties of the studied thin films. The topography of SnO2 thin films was examined by scanning electron microscopy (SEM). Furthermore, as-deposited films were characterized by X-ray diffraction (XRD), UV-Vis and impedance spectroscopy.

KW - Spin-coating

KW - Tin dioxide

KW - UV-Vis spectroscopy

KW - X-ray diffraction

UR - https://www.scopus.com/pages/publications/84940202177

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