Abstract
The paper presents the results of investigations involving the influence of drying time and annealing temperature on refractive index and thickness of two-component dielectric layers SiO 2:TiO 2 produced with the application of sol-gel technology. The production technology and the method for the determination of parameters of the produced layers has been discussed. The results of theoretical analysis of planar refractometer has been presented in the system of difference interferometer produced with the application of the elaborated planar waveguides.
| Original language | English |
|---|---|
| Article number | 31 |
| Pages (from-to) | 176-180 |
| Number of pages | 5 |
| Journal | Proceedings of SPIE - The International Society for Optical Engineering |
| Volume | 5576 |
| DOIs | |
| Publication status | Published - 2004 |
| Event | Lightguides and their Applications II, TAL 2003 - Krasnobrod, Poland Duration: 9 Oct 2003 → 11 Oct 2003 |
Keywords
- Planar sensor
- Planar waveguide
- Sol-gel
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Condensed Matter Physics
- Computer Science Applications
- Applied Mathematics
- Electrical and Electronic Engineering
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