@inproceedings{ec93fe99e8424d2085f3fb6057b3325a,
title = "Deterministic test pattern generator design",
abstract = "This paper presents a deterministic test pattern generator structure design based on genetic algorithm. The test pattern generator is composed of a linear register and a non-linear combinational function. This is very suitable solution for on-line built-in self-test implementations where functional units are tested in their idle cycles. In contrast to conventional approaches our multi-objective approach reduces the gate count of built-in self-test structure by concurrent optimization of multiple parameters that influence the final solution.",
author = "Gregor Papa and Tomasz Garbolino and Franc Novak",
year = "2008",
doi = "10.1007/978-3-540-78761-7\_21",
language = "English",
isbn = "3540787607",
series = "Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)",
publisher = "Springer Verlag",
pages = "204--213",
booktitle = "Applications of Evolutionary Computing - EvoWorkshops 2008",
address = "Germany",
note = "European Workshops on the Theory and Applications of Evolutionary Computation, EvoWorkshops 2008: EvoCOMNET, EvoFIN, EvoHOT, EvoIASP, EvoMUSART, EvoNUM, EvoSTOC, and EvoTransLog ; Conference date: 26-03-2008 Through 28-03-2008",
}