Detection, localisation and identification of interconnection faults using MISR compactor

T. Garbolino; M. Kopec; K. Gucwa; A. Hlawiczka

doi:10.1109/DDECS.2006.1649621

Detection, localisation and identification of interconnection faults using MISR compactor

T. Garbolino
, M. Kopec
, K. Gucwa
, A. Hlawiczka

Department of Digital Systems (RAU/RAU12)

Silesian University of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

2 Citations (Scopus)

Abstract

The paper introduces a novel idea of interconnect fault detection, localization and identification based on test response compaction using a MISR The above-mentioned operations are made at-speed. The localization is done by means of three long, full diagnostic resolution sequences: Walking 1 (W1), Walking 0 (WO) and a part of Johnson sequence (J). The final fault identification phase exploits information stored in two or three signatures

Original language	English
Title of host publication	2006 IEEE Design and Diagnostics of Electronic Circuits and systems
Pages	228-229
Number of pages	2
DOIs	https://doi.org/10.1109/DDECS.2006.1649621
Publication status	Published - 2006
Event	2006 IEEE Design and Diagnostics of Electronic Circuits and systems - Praque, Czech Republic Duration: 18 Apr 2006 → 21 Apr 2006

Publication series

Name	2006 IEEE Design and Diagnostics of Electronic Circuits and systems
Volume	2006

Conference

Conference	2006 IEEE Design and Diagnostics of Electronic Circuits and systems
Country/Territory	Czech Republic
City	Praque
Period	18/04/06 → 21/04/06

ASJC Scopus subject areas

General Engineering

Access to Document

10.1109/DDECS.2006.1649621

Cite this

Garbolino, T., Kopec, M., Gucwa, K., & Hlawiczka, A. (2006). Detection, localisation and identification of interconnection faults using MISR compactor. In 2006 IEEE Design and Diagnostics of Electronic Circuits and systems (pp. 228-229). Article 1649621 (2006 IEEE Design and Diagnostics of Electronic Circuits and systems; Vol. 2006). https://doi.org/10.1109/DDECS.2006.1649621

@inproceedings{87998b348dda4ba3ba51f0e608023fcf,

title = "Detection, localisation and identification of interconnection faults using MISR compactor",

abstract = "The paper introduces a novel idea of interconnect fault detection, localization and identification based on test response compaction using a MISR The above-mentioned operations are made at-speed. The localization is done by means of three long, full diagnostic resolution sequences: Walking 1 (W1), Walking 0 (WO) and a part of Johnson sequence (J). The final fault identification phase exploits information stored in two or three signatures",

author = "T. Garbolino and M. Kopec and K. Gucwa and A. Hlawiczka",

year = "2006",

doi = "10.1109/DDECS.2006.1649621",

language = "English",

isbn = "1424401852",

series = "2006 IEEE Design and Diagnostics of Electronic Circuits and systems",

pages = "228--229",

booktitle = "2006 IEEE Design and Diagnostics of Electronic Circuits and systems",

note = "2006 IEEE Design and Diagnostics of Electronic Circuits and systems ; Conference date: 18-04-2006 Through 21-04-2006",

}

Garbolino, T, Kopec, M, Gucwa, K & Hlawiczka, A 2006, Detection, localisation and identification of interconnection faults using MISR compactor. in 2006 IEEE Design and Diagnostics of Electronic Circuits and systems., 1649621, 2006 IEEE Design and Diagnostics of Electronic Circuits and systems, vol. 2006, pp. 228-229, 2006 IEEE Design and Diagnostics of Electronic Circuits and systems, Praque, Czech Republic, 18/04/06. https://doi.org/10.1109/DDECS.2006.1649621

Detection, localisation and identification of interconnection faults using MISR compactor. / Garbolino, T.; Kopec, M.; Gucwa, K. et al.
2006 IEEE Design and Diagnostics of Electronic Circuits and systems. 2006. p. 228-229 1649621 (2006 IEEE Design and Diagnostics of Electronic Circuits and systems; Vol. 2006).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AB - The paper introduces a novel idea of interconnect fault detection, localization and identification based on test response compaction using a MISR The above-mentioned operations are made at-speed. The localization is done by means of three long, full diagnostic resolution sequences: Walking 1 (W1), Walking 0 (WO) and a part of Johnson sequence (J). The final fault identification phase exploits information stored in two or three signatures

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Y2 - 18 April 2006 through 21 April 2006

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Detection, localisation and identification of interconnection faults using MISR compactor

Abstract

Publication series

Conference

ASJC Scopus subject areas

Access to Document

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