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Defect Detection in Textiles with Co-occurrence Matrix as a Texture Model Description

  • Future Processing

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

1 Citation (Scopus)

Abstract

Automatized inspection at textile production lines becomes very important. However, there is still a need to design methods which meet not only demands concerning accuracy of defect detection, but also ones related to the processing time. In this work, a novel approach for defect model definition is presented. It is derived from the idea of co-occurrence matrix. Due to scale incorporation and binarization of the model content it proved to be a very powerful descriptor of the novelties. Moreover, it also satisfies the requirements of short processing time. The defect mask achieved with the introduced method was compared visually to other popular solutions and show a very high accuracy and quality of defect description. The processing time is real-time as the response for a 1MP (megapixel) image is reached within tens of milliseconds.

Original languageEnglish
Title of host publicationCombinatorial Image Analysis - 19th International Workshop, IWCIA 2018, Proceedings
EditorsReneta P. Barneva, João Manuel R.S Tavares, Valentin E. Brimkov
PublisherSpringer Verlag
Pages216-226
Number of pages11
ISBN (Print)9783030052874
DOIs
Publication statusPublished - 2018
Event19th International Workshop on Combinatorial Image Analysis, IWCIA 2018 - Porto, Portugal
Duration: 22 Nov 201824 Nov 2018

Publication series

NameLecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)
Volume11255 LNCS
ISSN (Print)0302-9743
ISSN (Electronic)1611-3349

Conference

Conference19th International Workshop on Combinatorial Image Analysis, IWCIA 2018
Country/TerritoryPortugal
CityPorto
Period22/11/1824/11/18

Keywords

  • Co-occurrence matrix
  • Defect detection
  • Image segmentation

ASJC Scopus subject areas

  • Theoretical Computer Science
  • General Computer Science

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