Critical role of the deep electron trap in explaining the inconsistency of sensitivity-corrected natural and regenerative growth curves of quartz OSL at high irradiation doses

Natural quartz minerals that contain impurities, complex defect structures, and multiple trap levels within their crystals have been widely used for optically stimulated luminescence (OSL) dosimetry. Accurate application of the single-aliquot regenerative-dose (SAR) protocol requires an equivalence between the sensitivity-corrected natural and regenerative growth curves. In this work, the sensitivity-corrected natural and regenerative growth curves of quartz OSL are modelled using a comprehensive kinetic model based on the band theory of solids. We demonstrate that the trapping behaviour of the deep electron trap exerts a critical influence on the inconsistency of the sensitivity-corrected natural and regenerative growth curves at high irradiation doses. A delay in saturation of the deep electron trap at high irradiation doses leads to a substantial increase in electron competition in the recombination centres during the irradiation of the test dose and a decrease in electron competition in the centres during the subsequent stimulation of the test dose OSL. As a consequence, the test dose OSL responses as functions of irradiation doses are inconsistent (incompatible) between natural and regenerative aliquots, and the sensitivity-corrected regenerative growth curve tends to be higher than the natural one in the high-dose region. There may be substantial deep electron traps within the crystal of natural quartz that cause their delayed saturation at high irradiation doses.