Abstract
Rigorous computer analysis of the bipolar surface photovoltage (SPV), including contribution of surface states with U-shaped density distribution and Dember photo-effect, was performed for n-Si and n-GaAs surfaces. The initial surface band bending was varied from accumulation to inversion (in terms of the surface fixed charge QFC), and incident photon flux density from 105 to 1026 cm-2s-1. The behavior of SPV under weak and strong photo-excitation is discussed for possible use in surface characterization.
| Original language | English |
|---|---|
| Pages (from-to) | 173-177 |
| Number of pages | 5 |
| Journal | Vacuum |
| Volume | 54 |
| Issue number | 1-4 |
| DOIs | |
| Publication status | Published - Jul 1999 |
| Event | Proceedings of the 1998 19th International Seminar on Surface Physics - Polanica-Zdroj, Pol Duration: 15 Jun 1998 → 19 Jun 1998 |
ASJC Scopus subject areas
- Instrumentation
- Condensed Matter Physics
- Surfaces, Coatings and Films
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