Abstract
Rigorous computer simulations of the dependence of the band-to-band photoluminescence quantum efficiency (YPL) were performed for n-type InP surfaces in a wide range of excitation light intensity, Φ (from 1018 to 1025 cm-2 s-1). A strong influence of the density of surface states (NSS) and their capture cross sections for electrons (σn) and holes (σp) on YPL-Φ dependencies was found. We reproduced very well the experimental dependence YPL-Φ, taken from the literature, for the chemically polished InP (1 0 0) surface, which exhibited strong increase of YPL. From the fitting of the experimental data we determined the surface state parameters, including the minimum density of U-shaped continuum (NSS0 = 1011 eV-1 cm-2), and capture cross sections (σn = 10-14 cm2 and σp = 10-13 cm2). The best fitting was carried out using a fully-computer procedure based on a novel Simple-Genetic-Algorithm (SGA) concept. In addition, the behaviour of the effective surface recombination velocity (Seff), and quasi-Fermi levels for electrons (EFn) and holes (EFp) was discussed.
| Original language | English |
|---|---|
| Pages (from-to) | 223-227 |
| Number of pages | 5 |
| Journal | Vacuum |
| Volume | 63 |
| Issue number | 1-2 |
| DOIs | |
| Publication status | Published - 2 Jul 2001 |
| Event | 20th International Seminar on Surface Physics - Kudowa-Zdroj, Poland Duration: 19 Jun 2000 → 24 Jun 2000 |
Keywords
- Capture cross sections
- DIGS model
- Genetic algorithms
- InP surface
- Photoluminescence
- Surface recombination velocity
- Surface states
ASJC Scopus subject areas
- Instrumentation
- Condensed Matter Physics
- Surfaces, Coatings and Films
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