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Computer analysis of photoluminescence efficiency at InP surface with U-shaped surface state continuum

  • Silesian University of Technology
  • Hokkaido University

Research output: Contribution to journal › Conference article › peer-review

11 Citations (Scopus)

Abstract

Rigorous computer simulations of the dependence of the band-to-band photoluminescence quantum efficiency (YPL) were performed for n-type InP surfaces in a wide range of excitation light intensity, Φ (from 1018 to 1025 cm-2 s-1). A strong influence of the density of surface states (NSS) and their capture cross sections for electrons (σn) and holes (σp) on YPL-Φ dependencies was found. We reproduced very well the experimental dependence YPL-Φ, taken from the literature, for the chemically polished InP (1 0 0) surface, which exhibited strong increase of YPL. From the fitting of the experimental data we determined the surface state parameters, including the minimum density of U-shaped continuum (NSS0 = 1011 eV-1 cm-2), and capture cross sections (σn = 10-14 cm2 and σp = 10-13 cm2). The best fitting was carried out using a fully-computer procedure based on a novel Simple-Genetic-Algorithm (SGA) concept. In addition, the behaviour of the effective surface recombination velocity (Seff), and quasi-Fermi levels for electrons (EFn) and holes (EFp) was discussed.

Original languageEnglish
Pages (from-to)223-227
Number of pages5
JournalVacuum
Volume63
Issue number1-2
DOIs
Publication statusPublished - 2 Jul 2001
Event20th International Seminar on Surface Physics - Kudowa-Zdroj, Poland
Duration: 19 Jun 2000 → 24 Jun 2000

Keywords

  • Capture cross sections
  • DIGS model
  • Genetic algorithms
  • InP surface
  • Photoluminescence
  • Surface recombination velocity
  • Surface states

ASJC Scopus subject areas

  • Instrumentation
  • Condensed Matter Physics
  • Surfaces, Coatings and Films

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