Analog IC fault diagnosis by means of supply current monitoring in test points selected evolutionarily

Tomasz Golonek; Damian Grzechca; Jerzy Rutkowski

Analog IC fault diagnosis by means of supply current monitoring in test points selected evolutionarily

Tomasz Golonek
, Damian Grzechca
, Jerzy Rutkowski

Department of Electronics; Electrical Engineering and Microelectronics (RAU/RAU11)

Silesian University of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

10 Citations (Scopus)

Abstract

This paper describes the technique dedicated to an analog integrated circuit testing by means of supply current monitoring. The minimal set of test points, that allows to achieve the highest possible fault coverage, is determined with the use of genetic algorithm. Thanks to the proposed dynamic scheme of phenotype coding, the optimization process is more efficient than for a standard, static genotype structure realization.

Original language	English
Title of host publication	International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceedings
Pages	397-400
Number of pages	4
Publication status	Published - 2010
Event	International Conference on Signals and Electronic Systems, ICSES'10 - Gliwice, Poland Duration: 7 Sept 2010 → 10 Sept 2010

Publication series

Name	International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceeding

Conference

Conference	International Conference on Signals and Electronic Systems, ICSES'10
Country/Territory	Poland
City	Gliwice
Period	7/09/10 → 10/09/10

ASJC Scopus subject areas

Signal Processing
Electrical and Electronic Engineering

Cite this

Golonek, T., Grzechca, D., & Rutkowski, J. (2010). Analog IC fault diagnosis by means of supply current monitoring in test points selected evolutionarily. In International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceedings (pp. 397-400). Article 5595160 (International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceeding).

Golonek, Tomasz ; Grzechca, Damian ; Rutkowski, Jerzy. / Analog IC fault diagnosis by means of supply current monitoring in test points selected evolutionarily. International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceedings. 2010. pp. 397-400 (International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceeding).

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title = "Analog IC fault diagnosis by means of supply current monitoring in test points selected evolutionarily",

abstract = "This paper describes the technique dedicated to an analog integrated circuit testing by means of supply current monitoring. The minimal set of test points, that allows to achieve the highest possible fault coverage, is determined with the use of genetic algorithm. Thanks to the proposed dynamic scheme of phenotype coding, the optimization process is more efficient than for a standard, static genotype structure realization.",

author = "Tomasz Golonek and Damian Grzechca and Jerzy Rutkowski",

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series = "International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceeding",

pages = "397--400",

booktitle = "International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceedings",

note = "International Conference on Signals and Electronic Systems, ICSES'10 ; Conference date: 07-09-2010 Through 10-09-2010",

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Golonek, T , Grzechca, D & Rutkowski, J 2010, Analog IC fault diagnosis by means of supply current monitoring in test points selected evolutionarily. in International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceedings., 5595160, International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceeding, pp. 397-400, International Conference on Signals and Electronic Systems, ICSES'10, Gliwice, Poland, 7/09/10.

Analog IC fault diagnosis by means of supply current monitoring in test points selected evolutionarily. / Golonek, Tomasz ; Grzechca, Damian; Rutkowski, Jerzy.
International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceedings. 2010. p. 397-400 5595160 (International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceeding).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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AU - Golonek, Tomasz

AU - Grzechca, Damian

AU - Rutkowski, Jerzy

PY - 2010

Y1 - 2010

N2 - This paper describes the technique dedicated to an analog integrated circuit testing by means of supply current monitoring. The minimal set of test points, that allows to achieve the highest possible fault coverage, is determined with the use of genetic algorithm. Thanks to the proposed dynamic scheme of phenotype coding, the optimization process is more efficient than for a standard, static genotype structure realization.

AB - This paper describes the technique dedicated to an analog integrated circuit testing by means of supply current monitoring. The minimal set of test points, that allows to achieve the highest possible fault coverage, is determined with the use of genetic algorithm. Thanks to the proposed dynamic scheme of phenotype coding, the optimization process is more efficient than for a standard, static genotype structure realization.

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M3 - Conference contribution

AN - SCOPUS:78649305409

SN - 9788390474342

T3 - International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceeding

SP - 397

EP - 400

BT - International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceedings

T2 - International Conference on Signals and Electronic Systems, ICSES'10

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ER -

Analog IC fault diagnosis by means of supply current monitoring in test points selected evolutionarily

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ASJC Scopus subject areas

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