@inproceedings{63b76093048b44a39666e513a2105922,
title = "Analog circuits specifications testing by means of fast fourier transformation",
abstract = "The approach proposed in this paper engages FFT to the linear analog circuit specifications determination. The method allows to calculate the observed circuit under test parameter based on the step response analysis. The approximating equation that models the relationship between the selected frequency components and the observed specification is determined by means of multiple linear regression. The representative arguments of the estimating functions are determined respectively to the correlation coefficient analysis. This technique may be easily implemented to the devices which contain the microcontroller and analog part of the electronic circuit for which the testing is recommended. On the other hand, the approach is suitable for the specifications fast validation during the serial production, too.",
keywords = "analog circuits, correlation analysis, multiple regression, specifications driven testing",
author = "Tomasz Golonek",
note = "Publisher Copyright: {\textcopyright} 2016 IEEE.; 9th International Conference on Signals and Electronic Systems, ICSES 2016 ; Conference date: 05-09-2016 Through 07-09-2016",
year = "2016",
month = oct,
day = "18",
doi = "10.1109/ICSES.2016.7593811",
language = "English",
series = "2016 International Conference on Signals and Electronic Systems, ICSES 2016 - Proceedings",
publisher = "Institute of Electrical and Electronics Engineers Inc.",
pages = "13--18",
editor = "Witold Machowski and Jacek Stepien",
booktitle = "2016 International Conference on Signals and Electronic Systems, ICSES 2016 - Proceedings",
address = "United States",
}