An analogue integrated circuits yield optimisation with the use of genetic algorithm

Piotr Jantos; Damian Grzechca; Jerzy Rutkowski

An analogue integrated circuits yield optimisation with the use of genetic algorithm

Piotr Jantos
, Damian Grzechca
, Jerzy Rutkowski

Department of Electronics; Electrical Engineering and Microelectronics (RAU/RAU11)

Silesian University of Technology

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

1 Citation (Scopus)

Abstract

Design for Manufacturability and Yield is one of the most important concepts in analogue integrated circuits manufacturing. The process of adjusting the nominal values of circuit parameters allows for partial immunisation of its performance against deviations in value of the circuit's parameters. This paper proposes the use of an evolutionary tool, the genetic algorithm, for design centring. The process is based on encompassing an assumed integrated model and Monte Carlo analysis. The presented design centring method has been verified with the use of an example circuit, i.e. a CMOS operational amplifier.

Original language	English
Title of host publication	International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceedings
Pages	293-296
Number of pages	4
Publication status	Published - 2010
Event	International Conference on Signals and Electronic Systems, ICSES'10 - Gliwice, Poland Duration: 7 Sept 2010 → 10 Sept 2010

Publication series

Name	International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceeding

Conference

Conference	International Conference on Signals and Electronic Systems, ICSES'10
Country/Territory	Poland
City	Gliwice
Period	7/09/10 → 10/09/10

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

ASJC Scopus subject areas

Signal Processing
Electrical and Electronic Engineering

Cite this

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title = "An analogue integrated circuits yield optimisation with the use of genetic algorithm",

abstract = "Design for Manufacturability and Yield is one of the most important concepts in analogue integrated circuits manufacturing. The process of adjusting the nominal values of circuit parameters allows for partial immunisation of its performance against deviations in value of the circuit's parameters. This paper proposes the use of an evolutionary tool, the genetic algorithm, for design centring. The process is based on encompassing an assumed integrated model and Monte Carlo analysis. The presented design centring method has been verified with the use of an example circuit, i.e. a CMOS operational amplifier.",

author = "Piotr Jantos and Damian Grzechca and Jerzy Rutkowski",

year = "2010",

language = "English",

isbn = "9788390474342",

series = "International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceeding",

pages = "293--296",

booktitle = "International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceedings",

note = "International Conference on Signals and Electronic Systems, ICSES'10 ; Conference date: 07-09-2010 Through 10-09-2010",

}

Jantos, P, Grzechca, D & Rutkowski, J 2010, An analogue integrated circuits yield optimisation with the use of genetic algorithm. in International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceedings., 5595190, International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceeding, pp. 293-296, International Conference on Signals and Electronic Systems, ICSES'10, Gliwice, Poland, 7/09/10.

An analogue integrated circuits yield optimisation with the use of genetic algorithm. / Jantos, Piotr; Grzechca, Damian; Rutkowski, Jerzy.
International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceedings. 2010. p. 293-296 5595190 (International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceeding).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

T1 - An analogue integrated circuits yield optimisation with the use of genetic algorithm

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AU - Grzechca, Damian

AU - Rutkowski, Jerzy

PY - 2010

Y1 - 2010

N2 - Design for Manufacturability and Yield is one of the most important concepts in analogue integrated circuits manufacturing. The process of adjusting the nominal values of circuit parameters allows for partial immunisation of its performance against deviations in value of the circuit's parameters. This paper proposes the use of an evolutionary tool, the genetic algorithm, for design centring. The process is based on encompassing an assumed integrated model and Monte Carlo analysis. The presented design centring method has been verified with the use of an example circuit, i.e. a CMOS operational amplifier.

AB - Design for Manufacturability and Yield is one of the most important concepts in analogue integrated circuits manufacturing. The process of adjusting the nominal values of circuit parameters allows for partial immunisation of its performance against deviations in value of the circuit's parameters. This paper proposes the use of an evolutionary tool, the genetic algorithm, for design centring. The process is based on encompassing an assumed integrated model and Monte Carlo analysis. The presented design centring method has been verified with the use of an example circuit, i.e. a CMOS operational amplifier.

UR - https://www.scopus.com/pages/publications/78649251026

M3 - Conference contribution

AN - SCOPUS:78649251026

SN - 9788390474342

T3 - International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceeding

SP - 293

EP - 296

BT - International Conference on Signals and Electronic Systems, ICSES'10 - Conference Proceedings

T2 - International Conference on Signals and Electronic Systems, ICSES'10

Y2 - 7 September 2010 through 10 September 2010

ER -

An analogue integrated circuits yield optimisation with the use of genetic algorithm

Abstract

Publication series

Conference

UN SDGs

ASJC Scopus subject areas

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