TY - GEN
T1 - Adaptive algorithm for analog fault based on a sensitivity matrix and the fuzzy set theory
AU - Grzechca, Damian
AU - Rutkowski, Jerzy
PY - 2002
Y1 - 2002
N2 - Recently, most on going research has been focused on distinguishing faulty or healthy circuit - from the manufacturer's point of view, this is more important than locating particular faulty element. Faulty circuit is returned to design engineer and this person must consider the possibility of redesigning the schematic (if the problem occurs frequently). To find and locate faulty element in a circuit the sensitivity matrix can be used. It has been observed that for most practical circuits the sensitivity matrix is sparse. This observation has been utilized in the fuzzy expert system and the system modification based on the reduction of the sensitivity matrix size has been proposed. The modified system can effectively detect and locate single catastrophic faults as well as parametric ones. The first results obtained and presented here are promising and tend to prove that the proposed strategy can improve fault detection and location rate.
AB - Recently, most on going research has been focused on distinguishing faulty or healthy circuit - from the manufacturer's point of view, this is more important than locating particular faulty element. Faulty circuit is returned to design engineer and this person must consider the possibility of redesigning the schematic (if the problem occurs frequently). To find and locate faulty element in a circuit the sensitivity matrix can be used. It has been observed that for most practical circuits the sensitivity matrix is sparse. This observation has been utilized in the fuzzy expert system and the system modification based on the reduction of the sensitivity matrix size has been proposed. The modified system can effectively detect and locate single catastrophic faults as well as parametric ones. The first results obtained and presented here are promising and tend to prove that the proposed strategy can improve fault detection and location rate.
UR - https://www.scopus.com/pages/publications/77956441069
U2 - 10.1109/ICECS.2002.1046252
DO - 10.1109/ICECS.2002.1046252
M3 - Conference contribution
AN - SCOPUS:77956441069
SN - 0780375963
SN - 9780780375963
T3 - Proceedings of the IEEE International Conference on Electronics, Circuits, and Systems
SP - 649
EP - 652
BT - ICECS 2002 - 9th IEEE International Conference on Electronics, Circuits and Systems
T2 - 9th IEEE International Conference on Electronics, Circuits and Systems, ICECS 2002
Y2 - 15 September 2002 through 18 September 2002
ER -